What’s Holding Back Aging Simulation?


Aging simulation supplies information about the long-term behavior before an IC enters into production, providing an important early evaluation of the reliability required by the application and specification. Re-designs due to reliability issues, and over-design with excessive safety margins, are avoided in this way. In addition, the long-term stability can be demonstrated to the customer. ... » read more

Accelerated Life Testing For Failure Prediction


By Theresa Duncan and Chris South Product reliability is essential for success, especially for electronic products like printed circuit boards (PCB). Accelerated life testing (ALT) is an expedient and cost-effective solution to determine the reliability and robustness of an electronic product or component. ALT uncovers potential failure risks and quantifies the life characteristics of a p... » read more

Redefining Device Failures


Can a 5nm or 3nm chip really perform to spec over a couple decades? The answer is yes, but not using traditional approaches for designing, manufacturing or testing those chips. At the next few process nodes, all the workarounds and solutions that have been developed since 45nm don't necessarily apply. In the early finFET processes, for example, the new transistor structure provided a huge im... » read more

Reliability Challenges Grow For 5/3nm


Ensuring that chips will be reliable at 5nm and 3nm is becoming more difficult due to the introduction of new materials, new transistor structures, and the projected use of these chips in safety- and mission-critical applications. Each of these elements adds its own set of challenges, but they are being compounded by the fact that many of these chips will end up in advanced packages or modul... » read more

The Need For Traceability In Auto Chips


Someday your car will drive itself to a repair shop for a recall using a scheduling application that is both efficient and can prioritize which vehicles need to be fixed first. But that's still a ways off. Proactive identification of issues is not yet available. To be ready for that, today’s data analytics systems need to begin supporting targeted recalls, enabling predictive maintenance a... » read more

Test Is Becoming A Horizontal Process


Semiconductor test, once a discrete part of a well-orchestrated series of manufacturing steps, is looking more like a process that extends from the early concept stage in design to the end of life of whatever system that chip ultimately is used for. This has important ramifications for safety-critical markets in general, and the semiconductor industry in particular. Both worlds have been inc... » read more

Grading Chips For Longer Lifetimes


Figuring out how to grade chips is becoming much more difficult as these chips are used in applications where they are supposed to last for decades rather than just a couple of years. During manufacturing, semiconductors typically are run through a battery of tests involving performance and power, and then priced accordingly. But that is no longer a straightforward process for several reason... » read more

Enterprise-Class DRAM Reliability


Brett Murdock, product manager for memory interfaces at Synopsys, examines demand for DDR5 and DDR4 in both on-premise and cloud implementations, what features are available for which versions, how they affect performance and power, how ECC is implemented, and how the data moves throughout these systems. » read more

Challenges In Printed And Disposable Chips


Printing inexpensive chips using technology developed for newspapers and magazines is gaining traction across a wide range of applications, from photovoltaic cells to sensors on a flexible substrate. But it's also adding a slew of new challenges that are unique to this approach. The world of flexible hybrid electronics (FHE) — printing integrated circuits on or attaching thin IC chips to a... » read more

Improving Circuit Reliability


Carey Robertson, product marketing director at Mentor, a Siemens Business, examines reliability at advanced and mainstream nodes, particularly in automotive and industrial applications, what’s driving growing concern about the reliability and fidelity of analog circuits, and the impact of running circuits for longer periods of time under different voltage and environmental conditions. » read more

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