Enterprise-Class DRAM Reliability

By Ed Sperling - 06 Mar, 2020 - Comments: 0

Brett Murdock, product manager for memory interfaces at Synopsys, examines demand for DDR5 and DDR4 in both on-premise and cloud implementations, what features are available for which versions, how they affect performance and power, how ECC is implemented, and how the data moves throughout these systems. » read more

Challenges In Printed And Disposable Chips

By Susan Rambo And Ed Sperling - 05 Mar, 2020 - Comments: 0

Printing inexpensive chips using technology developed for newspapers and magazines is gaining traction across a wide range of applications, from photovoltaic cells to sensors on a flexible substrate. But it's also adding a slew of new challenges that are unique to this approach. The world of flexible hybrid electronics (FHE) — printing integrated circuits on or attaching thin IC chips to a... » read more

Improving Circuit Reliability

By Ed Sperling - 03 Mar, 2020 - Comments: 0

Carey Robertson, product marketing director at Mentor, a Siemens Business, examines reliability at advanced and mainstream nodes, particularly in automotive and industrial applications, what’s driving growing concern about the reliability and fidelity of analog circuits, and the impact of running circuits for longer periods of time under different voltage and environmental conditions. » read more

Artificial Intelligence For Industrial Applications

By Dirk Mayer - 13 Feb, 2020 - Comments: 0

By Dirk Mayer and Olaf Enge-Rosenblatt Due to digitalization, modern machines and systems provide massive quantities of data, which form a significant basis for the optimization of production processes, operations and safety. These data sets, however, grow more and more complex, which renders the simple analysis methods typically used in the past often ineffective. This is one factor driv... » read more

Making Light More Reliable

By Ed Sperling - 11 Feb, 2020 - Comments: 0

The buzz around photonics in packages and between packages is growing. Now the question is whether it will work as expected, and where it will be useful. Replacing electrical with optical signals has been on the technology horizon for some time. Light moves faster through fiber than electrons through copper. How much faster depends upon the diameter of the wires, the substrate and interconne... » read more

Using Machine Learning To Gain Data Insights

By Alex Burlak - 11 Feb, 2020 - Comments: 0

Today’s consumers have little appetite for networks that go down, for electronic devices that fail, and for any kind of digital service that doesn’t deliver as promised every time. Reliability is no longer a nice-to-have. It's a key feature. The continued scaling of advanced electronics and chip manufacturing technologies, however, makes reliability harder to achieve — even as expectati... » read more

More Data, More Problems In Automotive

By Anne Meixner - 11 Feb, 2020 - Comments: 0

The race toward increasing levels of autonomy is being hampered by competitive concerns over sharing data across the automotive supply chain. Pushing past the initial ADAS levels into full autonomy is expected to take more than a decade, but the infrastructure for those systems, and making sure all assisted and autonomous vehicles work with other vehicles, is under development today. Still, ... » read more

Failure Analysis Becoming Critical To Reliability

By Ed Sperling - 11 Feb, 2020 - Comments: 0

Failure analysis is rapidly becoming a complex, costly and increasingly time-consuming must-do task as demand rises for reliability across a growing range of devices used in markets ranging from automotive to 5G. From the beginning, failure analysis has been about finding out what went wrong in semiconductor design and manufacturing. Different approaches, tools and equipment have improved ov... » read more

Ensuring Functional Safety In Design

By Ed Sperling - 05 Feb, 2020 - Comments: 0

Mohammed Abdelwahid (Ali), automotive logic test product manager at Mentor, a Siemens Business, discusses how to maximize coverage in the different ASIL standards for logic BiST, how to make testing more efficient, and what impact that has on area and test time. » read more

How Chips Age

By Ed Sperling - 20 Jan, 2020 - Comments: 1

Andre Lange, group manager for quality and reliability at Fraunhofer IIS’ Engineering of Adaptive Systems Division, talks about circuit aging, whether current methods of predicting reliability are accurate for chips developed at advanced process nodes, and where additional research is needed. » read more

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Knowledge Centers
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