tag: reliability

Test More Complex For Cars, IoT
By Ann Mutschler - 15 Feb, 2017 - Comments: 0

With increasing focus on safety-critical semiconductors—driven by ADAS, IoT, and security—functional safety concerns are going through the roof. Engineering teams are scrambling to determine how to conduct better in-field or online testing because test no longer can be an afterthought. This has been a common theme across the automotive ecosystem for the past few years, and as the automot... » read more

What Can Go Wrong In Automotive
By Ed Sperling - 25 Jan, 2017 - Comments: 0

Semiconductor Engineering sat down to discuss automotive engineering with Jinesh Jain, supervisor for advanced architectures in Ford’s Research and Innovation Center in Palo Alto; Raed Shatara, market development for automotive infotainment at [getentity id="22331" comment="STMicroelectronics"]; Joe Hupcey, verification product technologist at [getentity id="22017" e_name="Mentor Graphics"]; ... » read more

BEOL Issues At 10nm And 7nm (Part 1)
By Ed Sperling - 15 Dec, 2016 - Comments: 5

Semiconductor Engineering sat down to discuss problems with the back end of line at leading-edge nodes with Craig Child, senior manager and deputy director for [getentity id="22819" e_name="GlobalFoundries'"] advanced technology development integration unit; Paul Besser, senior technology director at [getentity id="22820" comment="Lam Research"]; David Fried, CTO at [getentity id="22210" e_name... » read more

Tech Talk: Earlier Software
By Ed Sperling - 02 Nov, 2016 - Comments: 0

Malte Doerper, senior manager of product management at Synopsys, talks about the big "shift left" for software, where the problems crop up, and how to save as much as a year of development time with automation and better methodologies.   Related Stories Bridging Hardware And Software The need for concurrent hardware-software design and verification is increasing, but are engine... » read more

Meeting Reliability For Automotive Applications With PCI Express
By Richard Solomon - 14 Sep, 2016 - Comments: 0

Automotive electronics such as powertrain and braking controls, Advanced Driver Assistance Systems (ADAS), and other vehicle operations platforms, where reliability is of utmost importance must meet stringent reliability standards. Even an automotive infotainment system is expected to perform flawlessly even under a variety of temperatures, humidity, and vibrations. Reliability is a key compone... » read more

Tech Talk: Power Signoff
By Ed Sperling - 08 Sep, 2016 - Comments: 0

Ansys' Aveek Sarkar the challenges of power signoff at advanced process nodes, the impact of over-design, and what's necessary for sufficient coverage. [youtube vid=VQoT2KYW-AM] » read more

Automotive IC Design Drives Simulation Innovation
By Ahmed Eisawy - 01 Sep, 2016 - Comments: 0

By Roberto Stella, STMicroelectronics and Ahmed Eisawy, Mentor Graphics STMicroelectronics invented the Bipolar, CMOS, DMOS (BCD) technology for the intelligent power applications demanded by automotive ICs. This technology is widely-adopted by the automotive IC industry. But, designing automotive ICs is very challenging. It requires innovative techniques to ensure that the ICs can stand u... » read more

Connected Reliability Concerns
By Ed Sperling - 04 Aug, 2016 - Comments: 0

Ever since the invention of the integrated circuit, the focus has been on improving technology—making it faster, smaller, cheaper, while also cutting the power budget. With the advent of the IoT and ubiquitous connectivity, the value proposition will change. Rather than just improving the chip, the focus will shift to how that chip behaves in context. How does it work in a connected world... » read more

New Drivers For Test
By Brian Bailey - 28 Jul, 2016 - Comments: 0

Mention Design for Test (DFT) and scan chains come to mind, but there is much more to it than that—and the rules of the game are changing. New application areas such as automotive may breathe new life into built-in self-test (BIST) solutions, which could also be used for manufacturing test. So could DFT as we know it be a thing of the past? Or will it continue to have a role to play? Te... » read more

Mixed-signal/Low-power Design
By Jeff Dorsch - 26 Jul, 2016 - Comments: 0

Semiconductor Engineering sat down to discuss mixed-signal/low-power IC design with Phil Matthews, director of engineering at Silicon Labs; Yanning Lu, director of analog IC design at Ambiq Micro; Krishna Balachandran, director of low power solutions marketing at [getentity id="22032" comment="Cadence"]; Geoffrey Ying, director of product marketing, AMS Group, [getentity id="22035" e_name="Syno... » read more

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