Breakthrough For Scan Diagnosis With Machine Learning


Cell-aware diagnosis is a new and effective way to detect defects inside standard cells. Industry standard failure analysis (FA) results from a major foundry show that cell-aware diagnosis is very effective at increasing the resolution of the diagnosis by reducing the number of suspects in cell-internal defect data. With advanced technology nodes, we have more complex layout structures and f... » read more

Building Bridges: A New DFT Paradigm


Over the last twenty years, structural testing with scan chains has become pervasive in chip design methodology. Indeed, it’s remarkable to think that most electronic devices we interact with today (think smartphones, laptops, televisions, etc.) contain hundreds to thousands of interconnected scan chains used to verify that the semiconductors were manufactured without defects. Because the imp... » read more

Understanding NI CompactRIO Scan Mode


The LabVIEW Real-Time Module 8.6 introduced powerful new features for programming CompactRIO hardware that reduce development time and complexity as well as provide tools for monitoring and maintaining CompactRIO applications. This functionality is powered by two technologies in LabVIEW, the NI Scan Engine and the RIO Scan Interface. The NI Scan Engine is a new component of LabVIEW Real-Time th... » read more

Safety Plus Security: A New Challenge


Nobody has ever integrated safety or security features into their design just because they felt like it. Usually, successive high-profile attacks are needed to even get an industry's attention. And after that, it's not always clear how to best implement solutions or what the tradeoffs are between cost, performance, and risk versus benefit. Putting safety and security in the same basket is a ... » read more

Fault Simulation Reborn


Fault simulation, one of the oldest tools in the EDA industry toolbox, is receiving a serious facelift after it almost faded from existence. In the early days, fault simulation was used to grade the quality of manufacturing test vectors. That task was replaced almost entirely by [getkc id="173" comment="scan test"] and automatic test pattern generation (ATPG). Today, functional safety is cau... » read more