How Big A Deal Is Aging?


Nothing lasts forever, but in the semiconductor world things used to last long enough to become obsolete long before their end of life. That's no longer the case with newer nodes, and it is raising concerns in safety-critical markets such as automotive. Being able to fully understand what happens inside of chips is still a work in progress, and analysis approaches are trying to keep up. Unti... » read more

Unbundling Analog From Digital Where It Makes Sense


Semiconductor Engineering sat down to discuss what's changing in analog design with the shift toward heterogeneous integration and more safety- and mission-critical applications with Mo Faisal, president and CEO of Movellus; Hany Elhak, executive director of product management at Synopsys; Cedric Pujol, product manager at Keysight; and Pradeep Thiagarajan, principal product manager for custom I... » read more

Mass Customization For AI Inference


Rising complexity in AI models and an explosion in the number and variety of networks is leaving chipmakers torn between fixed-function acceleration and more programmable accelerators, and creating some novel approaches that include some of both. By all accounts, a general-purpose approach to AI processing is not meeting the grade. General-purpose processors are exactly that. They're not des... » read more

Shift Left The Design Process With Calibre Interactive Symmetry Checking


The traditional methods of symmetry checking are due for an update. The Calibre interactive, no code symmetry checking solution helps designers capture symmetry issues very early in the design cycle to reduce the number of iterations. Calibre interactive symmetry checking shifts left the whole verification process and reduces the time needed to reach tape out. What you’ll learn: Why the... » read more

Metrology Advances Step Up To Sub-2nm Device Node Needs


Metrology and inspection are dealing with a slew of issues tied to 3D measurements, buried defects, and higher sensitivity as device features continue to shrink to 2nm and below. This is made even more challenging due to increasing pressure to ramp new processes more quickly. Metrology tool suppliers must exceed current needs by a process node or two to ensure solutions are ready to meet tig... » read more

New Challenges In IC Reliability


Experts at the Table: Semiconductor Engineering sat down to discuss reliability of chips, how it is changing, and where the new challenges are, with Steve Pateras, vice president of marketing and business development at Synopsys; Noam Brousard, vice president of solutions engineering at proteanTecs; Harry Foster, chief verification scientist at Siemens EDA; and Jerome Toublanc, high-tech soluti... » read more

Signals In The Noise: Tackling High-Frequency IC Test


The need for high-frequency semiconductor devices is surging, fueled by growing demand for advanced telecommunications, faster sensors, and increasingly autonomous vehicles. The advent of millimeter-wave communication in 5G and 6G is pushing manufacturers to develop chips capable of handling frequencies that were once considered out of reach. However, while these technologies promise faster ... » read more

Government Chip Funding Spreads Globally


This is the first in a series of articles tracking government chip investments. See part two for Americas-focused funding and part three for the UK and EMEA, and part four for Asia. Countries around the world are ramping up investments into their semiconductor industries as part of new or existing approaches. The increased government activity stems from growing awareness of the strategic imp... » read more

Partitioning In The Chiplet Era


The widespread adoption of chiplets in domain-specific applications is creating a partitioning challenge that is much more complex than anything chip design teams have dealt with in previous designs. Nearly all the major systems companies, packaging houses, IDMs, and foundries have focused on chiplets as the best path forward to improve performance and reduce power. Signal paths can be short... » read more

Accelerating Reset Domain Crossing Verification With Data Analytics Techniques


By Reetika and Sulabh Kumar Khare As the complexity of integrated circuit (IC) designs continues to rise, the task of verifying these designs has become increasingly challenging. The pace of this growth is staggering, with design complexity doubling roughly every 20 months. This exponential increase places immense pressure on verification processes, which must keep up to ensure that these so... » read more

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