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Streaming Scan Network


The traditional approach to moving scan test data from chip-level pins to core-level scan channels is under pressure due to the dramatic rise in design size, design complexity, and test adaptation. In the traditional approach to delivering scan test data to cores, each core requires a dedicated connection to chip-level pins, which doesn’t allow for much flexibility, as the dependencies betwee... » read more

Packetized Scan Test Delivery


The traditional approach to moving scan test data from chip-level pins to core-level scan channels is under pressure due to the dramatic rise in design size, design complexity, and test adaptation. To address these challenges, we now have the option of implementing a packetized data network for scan test that moves the scan data through the SoC much more efficiently than the traditional pin-... » read more

Have It All With No-Compromise DFT


The dramatic rise in manufacturing test time for today’s large and complex SoCs is rooted in the use of traditional approaches to moving scan test data from chip-level pins to core-level scan channels. The pin-multiplexing (mux) approach works fine for smaller designs but can become problematic with an increase in the number of cores and the design complexity on today’s SoCs. The next revol... » read more