tag: Synopsys

Die-To-Die Stress Becomes A Major Issue
By Ann Mutschler - 14 Jan, 2021 - Comments: 2

Stress is becoming more critical to identify and plan for at advanced nodes and in advanced packages, where a simple mismatch can impact performance, power, and the reliability of a device throughout its projected lifetime. In the past, the chip, package, and board in a system generally were designed separately and connected through interfaces from the die to the package, and from the packag... » read more

More Data, More Memory-Scaling Problems
By Bryon Moyer - 14 Jan, 2021 - Comments: 0

Memories of all types are facing pressures as demands grow for greater capacity, lower cost, faster speeds, and lower power to handle the onslaught of new data being generated daily. Whether it's well-established memory types or novel approaches, continued work is required to keep scaling moving forward as our need for memory grows at an accelerating pace. “Data is the new economy of this ... » read more

112G SerDes Modeling And Integration Considerations
By Priyank Shukla - 14 Jan, 2021 - Comments: 0

The ever-increasing demand for compute power and data processing in accelerators, intelligence processing units (IPUs), GPUs, as well as training and inference SoCs is driving the adoption of 112G SerDes PHY IP solutions. Ensuring a reliable Ethernet link and efficient integration are the most essential requirements that designers need to meet. IBIS-AMI modeling can help predict SerDes link per... » read more

Machine Learning — Everywhere: Enabling Self-Optimizing Design Platforms for Better End-to-End Results
By Synopsys - 13 Jan, 2021 - Comments: 0

Machine-learning offers opportunities to enable self-optimizing design tools. Very much like self-driving cars that observe real-world interactions to improve their responses in different (local) driving conditions, AI-enhanced tools are able to learn and improve in (local) design environments after deployment. These new, ML-driven capabilities can be embedded in different design engines, gi... » read more

Blog Review: Jan. 13
By Jesse Allen - 13 Jan, 2021 - Comments: 0

Siemens EDA's Harry Foster tracks trends in IC and ASIC design and finds that increased design size is only one dimension of the growing complexity challenge. Synopsys' Chris Clark and Dennis Kengo Oka predicts how the automotive industry will change in 2021, including new standards for security, increased use of AI and V2X technologies, and a growing focus on software. Cadence's Paul McL... » read more

Too Much Fab And Test Data, Low Utilization
By Anne Meixner - 12 Jan, 2021 - Comments: 7

Can there be such a thing as too much data in the semiconductor and electronics manufacturing process? The answer is, it depends. An estimated 80% or more of the data collected across the semiconductor supply chain is never looked at, from design to manufacturing and out into the field. While this may be surprising, there are some good reasons: Engineers only look at data necessary to s... » read more

Testing Silicon Photonics In Production
By Bryon Moyer - 12 Jan, 2021 - Comments: 1

As silicon photonics costs come down, the technology is being worked into new applications, from connectivity to AI. But full commercial production requires testing those photonic circuits before shipping them. Photonics testing is only getting started. Volume production is still not happening, and test equipment and techniques are still being developed. What exists today is a blend of exist... » read more

DFT For SoCs Is Last, First, And Everywhere In Between
By Robert Ruiz - 12 Jan, 2021 - Comments: 0

Back in the dawn of time, IC test was the last task in the design flow. First, you designed the chip and then you wrote the functional test program to verify it performed as expected after manufacturing. Without much effort, some portion of the functional test program was often reused as the manufacturing test to determine that the silicon was defect-free. Fast forward to today and things ha... » read more

Verifying Safety-Critical FPGA Designs With Fault Simulation
By Synopsys - 12 Jan, 2021 - Comments: 0

Supporting safety and assurance in designs, such as the chips used in industrial, aerospace and defense applications, requires more than traditional functional verification. Even if every bug is found and fixed before release, these applications have additional requirements for functional safety. They must be able to handle a variety of faults and induced errors, either by correcting them or by... » read more

Week In Review: Auto, Security, Pervasive Computing
By SE Staff - 08 Jan, 2021 - Comments: 0

Automotive/Mobility Autonomous car company Waymo is making a point of not calling itself a self-driving car company because the company said in a blog to do so would be a dangerously misleading. Waymo says it will instead call its technology ‘fully autonomous driving technology.’ “Unfortunately, we see that some automakers use the term ‘self-driving’ in an inaccurate way, giving cons... » read more

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