Blog Review: Nov. 16


Siemens EDA's Jake Wiltgen explains the difference between transient and permanent faults when designing to the ISO 26262 standard, including where they come from and key ways to protect against them. Synopsys' Vikas Gautam points to how the economics of designing large SoCs is driving chiplet-based designs and the need for die-to-die standards such as UCIe, along with the key protocol verif... » read more

Ensuring Memory Reliability Throughout the Silicon Lifecycle


By Anand Thiruvengadam and Guy Cortez Memories are everywhere in modern electronics. Discrete memory chips account for much of the space on printed circuit boards (PCBs). Embedded memories consume much of the floorplan in system-on-chip (SoC) devices. Many multi-die chip configurations, including 2.5D/3DIC devices, are driven by the need for faster memory access. Designing and verifying memo... » read more

Week In Review: Semiconductor Manufacturing, Test


U.S. President Joe Biden appears ready to increase pressure on Japan and the Netherlands to help block the flow of advanced chip technology to China, where it can be used to develop cutting-edge weapons. "You will see Japan and Netherlands follow our lead," U.S. Commerce Secretary Gina Raimondo told CNBC. Japan plans to budget ¥350 billion ($2.38 billion) in a research collaboration with th... » read more

Taking Power Much More Seriously


An increasing number of electronic systems are becoming limited by thermal issues, and the only way to solve them is by elevating energy consumption to a primary design concern rather than a last-minute optimization technique. The optimization of any system involves a complex balance of static and dynamic techniques. The goal is to achieve maximum functionality and performance in the smalles... » read more

Accelerating IoT Designs: Designing For Low Power In The Era Of Smart Everything


Most of us have become accustomed to interacting with the ubiquitous technology ecosystem daily (if not hourly). From fitness trackers, smart vacuums, and semi-autonomous vehicles to the smart home devices that wake us up every morning, there’s no denying that the internet of things (IoT) boom has proliferated in every aspect of our lives. At the core of this instant, at-our-fingertips conn... » read more

Solving Thermal Coupling Issues In Complex Chips


Rising chip and packaging complexity is causing a proportionate increase in thermal couplings, which can reduce performance, shorten the lifespan of chips, and impact overall reliability of chips and systems. Thermal coupling is essentially a junction between two devices, such as a chip and a package, or a transistor and a substrate, in which heat is transferred from one to the other. If not... » read more

Balancing Power And Heat In Advanced Chip Designs


Power and heat use to be someone else's problem. That's no longer the case, and the issues are spreading as more designs migrate to more advanced process nodes and different types of advanced packaging. There are a number of reasons for this shift. To begin with, there are shrinking wire diameters, thinner dielectrics, and thinner substrates. The scaling of wires requires more energy to driv... » read more

Blog Review: Nov. 9


Cadence's Claire Ying finds that the latest update to CXL, which introduced memory-centric fabric architectures and expanded capabilities for improving scale and optimizing resource utilization, could change how some of the world’s largest data centers and fastest supercomputers are built. Synopsys' Gervais Fong and Morten Christiansen examine the latest updates in the USB 80Gbps specifica... » read more

How Low Can You Go? Pushing The Limits Of Transistors


Rising demand for cutting-edge mobile, IoT, and wearable devices, along with high compute demands for AI and 5G/6G communications, has driven the need for lower power systems-on-chip (SoCs). This is not only a concern for a device’s power consumption when active (dynamic power), but also when the device is not active (leakage power). This highly competitive industry provides significant rewar... » read more

Next Steps For Improving Yield


Chipmakers are ramping new tools and methodologies to achieve sufficient yield faster, despite smaller device dimensions, a growing number of systematic defects, immense data volumes, and massive competitive pressure. Whether a 3nm process is ramping, or a 28nm process is being tuned, the focus is on reducing defectivity. The challenge is to rapidly identify indicators that can improve yield... » read more

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