Chip Industry Week In Review

By The SE Staff - 17 Apr, 2026 - Comments: 0

Acquisitions and business pivots Teradyne acquired Israel-based TestInsight, a semiconductor test provider with pattern conversion, validation, and virtual test capabilities. Credo plans to acquire DustPhotonics, a developer of silicon photonics PICs for optical transceivers. Molex plans to acquire Teramount, a provider of detachable, passive-alignment fiber-to-chip connectivity solu... » read more

AI data Center Providers Seek Power and Bandwidth Promise in CPO

By Teradyne - 07 Apr, 2026 - Comments: 0

Co-packaged optics (CPO), a high-speed networking technology that integrates optical components (lasers, photodetectors) directly with switch/compute chips (ASICs) in the same package, continues to show promise. Advocates of CPO maintain that it reduces power consumption by over 80% and increases bandwidth density by shortening electrical traces to millimeters. Used primarily in data cente... » read more

AI Accelerators Usher In New Era For IC Test

By Laura Peters - 07 Apr, 2026 - Comments: 0

Key Takeaways The parallelism in AI accelerators enables low latency but complicates failure isolation. HBM can account for 50% of package cost, so known-good stack assurance is critical. DFT and test cooperate to solve final test, singulated die test, SLT, and in-system test for data centers. AI accelerators are used for everything from training large language models to mak... » read more

Chip Industry Week In Review

By The SE Staff - 20 Mar, 2026 - Comments: 0

War impacts The Iran War's toll on the chip industry is widening. Over 95% of Taiwan's energy is imported, causing the country to secure alternative sources. Korea is also heavily dependent on energy imports from the Middle East. Shortages of key materials are cropping up everywhere. Helium from Qatar, the second largest producer behind the U.S., is constrained by hostilities in the Per... » read more

Chip Industry Week In Review

By The SE Staff - 13 Mar, 2026 - Comments: 0

Disruptions caused by the Iran conflict have taken about one third of the global helium supply off the market, an essential gas for semiconductor manufacturing, reports the World Economic Forum. Other potential impacts for the chip industry include bromine and other chemical shortages, logistical disruptions, and higher energy prices incurred by fabs in Asia. Top Deals IBM and Lam R... » read more

Tool Matching Getting Tougher Across Test & Metrology

By Laura Peters - 10 Mar, 2026 - Comments: 0

Key Takeaways Engineers leverage both device-specific and tool-level data to identify a process "sweet spot." Tight, frequent tool-to-tool matching enables greater yield and fab flexibility. Machine learning helps capture the nuances of a tool's signature. Many people outside of the semiconductor industry wonder how humans can fabricate transistors with tens of nanometer sca... » read more

How AI Is Changing Computing And Why Testing Is Critical

By Jeorge Hurtarte - 10 Mar, 2026 - Comments: 0

Artificial intelligence (AI) is transforming industries, enhancing our daily lives, and improving efficiency and decision-making, but its need for compute processing power is growing at an astonishing rate, doubling every three months (Figure 1). To maintain this pace, the semiconductor industry is moving beyond traditional chip development – it has entered the era of heterogeneous chiplets i... » read more

Digital Twins: The Cloud’s The Limit

By Ed Sperling - 10 Mar, 2026 - Comments: 1

Key Takeaways Digital twins are gaining traction as a way of testing different options at every step of the design-through-manufacturing flow. AI can be used to glue together disparate data types in multi-physics simulations. The promise of digital twins is huge, but multiple challenges need to be solved before it can live up to its potential. Digital twin technology is draw... » read more

Resistance In Advanced Packages Is Now A System-Level Problem

By Gregory Haley - 10 Feb, 2026 - Comments: 0

Key Takeaways Kelvin measurement, which has been in use for decades, is no longer sufficient for addressing resistance in complex chips. The problem is that resistance is no longer concentrated in transistors, and where it does show up isn't always consistent or obvious. Traditional pass/fail approaches need to be replaced by more granular and flexible analytics and methodologies. ... » read more

Chiplets Add More Inspection And Test Steps

By Anne Meixner - 10 Feb, 2026 - Comments: 0

Key Takeaways Ensuring the reliability of multi-die assemblies requires a variety of approaches to detect subsurface defects. Bonds and interconnects are especially problematic and require more inspection insertions. Ensuring reliability requires connecting fragmented data that is often siloed. The shift to multi-die assemblies is forcing changes in how chips are tested and ... » read more

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tag: Teradyne

Chip Industry Week In Review

AI data Center Providers Seek Power and Bandwidth Promise in CPO

AI Accelerators Usher In New Era For IC Test

Chip Industry Week In Review

Chip Industry Week In Review

Tool Matching Getting Tougher Across Test & Metrology

How AI Is Changing Computing And Why Testing Is Critical

Digital Twins: The Cloud’s The Limit

Resistance In Advanced Packages Is Now A System-Level Problem

Chiplets Add More Inspection And Test Steps

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