Practical Ways To Reduce Test Time


If someone said that paper never refused ink, they could have said the same about test programs and tests. Early on in my career as a test development engineer, I commented out all tests except the key test for the new product I was working on. This allowed me to isolate the test and fix its repeatability. The next pre-production run finished much earlier than I expected and I was impressed ... » read more

Utilizing More Data To Improve Chip Design


Just about every step of the IC tool flow generates some amount of data. But certain steps generate a mind-boggling amount of data, not all of which is of equal value. The challenge is figuring out what's important for which parts of the design flow. That determines what to extract and loop back to engineers, and when that needs to be done in order to improve the reliability of increasingly com... » read more

Using Data Analytics More Effectively


The semiconductor industry is under a lot of pressure from their customers nowadays. They’re expected to keep up with consumer expectations for shorter electronic product life cycles, without compromising on the reliability and quality of the components and products coming off the line. A recent article from McKinsey & Company, however, describes how quality procedures have become a bottl... » read more

Finally, Realizing The Full Benefits Of Parallel Site-To-Site (S2S) Testing


A very common and well-known practice by manufacturers during the IC test process is to test as many of the device die or packaged parts as possible in parallel (i.e. sites) during wafer sort and final test in order to increase test time efficiency and lower overall test costs. The constraints that typically restrict how many test sites can be used at any given time are the design I/O and capac... » read more