Using Data Analytics More Effectively


The semiconductor industry is under a lot of pressure from their customers nowadays. They’re expected to keep up with consumer expectations for shorter electronic product life cycles, without compromising on the reliability and quality of the components and products coming off the line. A recent article from McKinsey & Company, however, describes how quality procedures have become a bottl... » read more

Finally, Realizing The Full Benefits Of Parallel Site-To-Site (S2S) Testing


A very common and well-known practice by manufacturers during the IC test process is to test as many of the device die or packaged parts as possible in parallel (i.e. sites) during wafer sort and final test in order to increase test time efficiency and lower overall test costs. The constraints that typically restrict how many test sites can be used at any given time are the design I/O and capac... » read more