System-Level Test Methodologies Take Center Stage


Because electronic systems for all applications in end-user markets must provide the highest possible reliability to match customers’ quality expectations, semiconductor components undergo multiple tests and stress steps to screen out defects that could arise during their lifecycle. Due to new semiconductor devices’ increasing design complexity and extreme process technology, increased test... » read more

Predicting Reliability At 3/2nm And Beyond


The chip industry is determined to manufacture semiconductors at 3/2nm — and maybe even beyond — but it's unlikely those chips will be the complex all-in-one SoCs that have defined advanced electronics over the past decade or so. Instead, they likely will be one of many tiles in a system that define different functions, the most important of which are highly specialized for a particular app... » read more

Introduction To Test Data Formats


This blog is intended to provide an introduction to STDF and ATDF data formats. This is not intended to be definitive, only an introduction. If you are experienced with seeing data in spreadsheets and tables, then STDF is very different from what you are used to. Here we try to explain. STDF is the “Standard Test Data Format” developed jointly between some of the largest test equipment v... » read more

Test Engineers In Very Short Supply


Semiconductor design, verification, manufacturing, and test requires an army of engineers, with each playing a special role. But increasingly, these disciplines also require additional training to be able to understand the context around their jobs, and that is making it harder to fill different positions at a time when the chip industry already is severely short-staffed. This is particularl... » read more

Silo Busting In The Design Flow


An increasing number of dependencies in system design are forcing companies, people, tools, and flows to become more collaborative. Design and EDA companies must adapt to this new reality because it has become impossible for anyone to do it all by themselves. Moreover, what happens in manufacturing and packaging needs to be considered up front, and what gets designed in the design phase may ... » read more

Taking Advantage Of Outsourced Test Services


The business model in today’s competitive world of commerce has shifted over recent years to “services.” Companies like Microsoft, Amazon and Google are prime success stories that have advanced the industry with business-enabling services. These economic productivity improvement services allow their customers to focus on product architecture, design and quick time to market. The service p... » read more

Making IC Test Faster And More Accessible: Part 2


Recently, my colleague Robert Ruiz described a new approach to scan test that utilizes the high-speed I/O (HSIO) ports that exist on most chips. The benefits of this new approach include reduced test time and cost thanks to the high-speed interface. Simplified pin electronics and tester setup are also benefits, as is the ability to run manufacturing tests in the field in support of silicon life... » read more

Modified X-Band Push-Push Oscillator Simulation And Measurement


This eBook that explores the push-push oscillator configuration via harmonic balance (HB) computer simulation and test measurement. The unique operation of the push-push oscillator configuration is explored using HB simulation of spectral content and time-domain voltage waveforms. Dynamic load lines are investigated and utilized to explore peak signal excursion and degree of nonlinearity. Predi... » read more

Does HW Vs. SW Choice Affect Quality And Reliability?


Electronic systems comprise both hardware and software. Which functions are implemented with hardware and which with software are decisions made based upon a wide variety of considerations, including concerns about quality and reliability. Hardware may intrinsically provide for higher device quality, but it is also the source of reliability concerns. This is in contrast with popular views of... » read more

Making IC Test Faster And More Accessible: Part 1


The fundamental challenges of IC test have been the same for a long time. At the heart of all test strategies is controllability and observability. First, control the state of the chip with known test vectors and then observe the chip to determine if it exhibits good or faulty behavior. There have been many innovations over the years to make the required testing of chips more tractable. Thanks ... » read more

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