tag: test

AI Chip DFT Techniques For Aggressive Time-To-Market
By Mentor, a Siemens Business - 09 Apr, 2019 - Comments: 0

AI chips have aggressive time-to-market goals. Designers can shave significant time off of DFT and silicon bring up using the techniques described in this paper. Leading AI semiconductor companies have already had success with Tessent DFT tools. To read more, click here. » read more

Own Test Architecture To Meet Ever-Growing Test Coverage
By NI - 09 Apr, 2019 - Comments: 0

Automotive consumers worldwide are increasingly basing their purchase decisions on the vehicle’s user interface, or human-machine interface (HMI). An in-vehicle infotainment (IVI) or car multimedia system, together with a digital cockpit, heavily influences how drivers and passengers feel about vehicles. And while HMI-related automotive electronics account for 70 percent of all in-car code, e... » read more

Redefining Expectations For Test
By Synopsys - 03 Apr, 2019 - Comments: 0

New and rapidly expanding applications, such as artificial intelligence and automotive, are increasing in design size and complexity. These evolving market segments require unprecedented levels of quality and long-term reliability, which has created a fundamental shift in both the importance and need for integration of advanced semiconductor test. Synopsys unveiled a new family of test products... » read more

Week In Review: Design, Low Power
By Jesse Allen - 22 Mar, 2019 - Comments: 0

Synopsys announced several new products: a new test family, a physical verification solution, and a software library for neural net SoCs. TestMAX, the new family of test products, includes soft error analysis and X-tolerant logic BIST for automotive test and functional safety requirements. TestMAX enables test through functional high-speed interfaces and supports early validation of DFT logi... » read more

Gaps In 5G Test
By Kevin Fogarty - 20 Mar, 2019 - Comments: 0

Add one more industry to the long list that analysts expect 5G technology to disrupt—test. While the initial versions of this wireless technology will be little more than a faster version of 4G, concern is growing about exactly how to test the second phase of this technology, which will be based upon millimeter wave. A number of fundamental problems need to be addressed. Among them: T... » read more

IC Test: Doing It At The Right Place At The Right Time
By Rohit Kapur - 14 Mar, 2019 - Comments: 1

In the real world, we are slaves to our environment. The decisions we make are dependent on the resources available at any given time. In school, I remember coming up with a binary decision diagram (BDD) variable-ordering algorithm that relied on partial BDDs. Was that the best algorithm to determine the variable ordering of a BDD for a design? Probably not. However, it was easy to do as a coll... » read more

The 3 Main Obstacles To Zero DPPM And How To Overcome Them
By Randy Hierbaum - 12 Mar, 2019 - Comments: 0

As we all well know, there are multiple mission critical applications in today’s “Age of Smart” that are calling for zero DPPM (defective parts per million) in semiconductors and electronic systems. In industries such as automotive, medical, aerospace, and more, where lives are at stake, defective parts are not an option. The quality imperative However, with the ever-growing complexi... » read more

Home Automation IoT Company Cuts ASIC Testing Costs
By DELTA, a part of FORCE Technology - 12 Mar, 2019 - Comments: 0

digitalSTROM develops smart home automation solutions providing users with superior comfort and a whole new style of living. Based on proprietary ASIC and software, digitalSTROM’s solutions connect electrical household appliances through existing power lines and enable an intelligent home via light switches, free speaking using Amazon Echo, and other apps. Challenges At the heart of digit... » read more

Using Sensor Data To Improve Yield And Uptime
By Ed Sperling - 21 Feb, 2019 - Comments: 2

Semiconductor equipment vendors are starting to add more sensors into their tools in an effort to improve fab uptime and wafer yield, and to reduce cost of ownership and chip failures. Massive amounts of data gleaned from those tools is expected to provide far more detail than in the past about multiple types and sources of variation, including when and where that variation occurred and how,... » read more

Why Analog Designs Fail
By Brian Bailey - 14 Feb, 2019 - Comments: 2

The gap between analog and digital reliability is growing, and digital designs appear to be winning. Reports show that analog content causes the most test failures and contributes significantly more than digital to field returns. The causes aren't always obvious, though. Some of it is due to the maturity of analog design and verification. While great strides have been made in digital circuit... » read more

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