tag: test

Analog Fault Simulation Challenges And Solutions
By Mentor, a Siemens Business - 28 Sep, 2016 - Comments: 0

The test time for digital circuit blocks in ICs has greatly decreased in the last 20 years, thanks to scan-based design-for-test (DFT), automatic test pattern generation (ATPG) tools, and scan compression. These technologies have greatly reduced the number of test vectors applied by automatic test equipment (ATE) while maximizing the coverage of a wide range of defect types. But for analog c... » read more

Accelerate Time To Market With Change Impact Testing
By Synopsys - 07 Sep, 2016 - Comments: 0

QA teams don’t have time to test everything yet they can’t afford to ship buggy code. Teams waste precious resources on tests that have no relevance to the changes that were made to the application. And worse, there may be holes in the testing coverage which could lead to regression risk. Learn how Coverity can help organizations shrink their testing cycles and reduce regression risk by foc... » read more

Putting Design Back Into DFT
By Brian Bailey - 25 Aug, 2016 - Comments: 0

Test always has been a delicate balance between cost and quality, but there are several changes happening in the industry that might cause a significant alteration in strategy. Part one of this two part series about [getkc id="47" comment="Design for Test (DFT)"] looked at changes in areas such as automotive, where built in self-test is becoming a mandated part of the design process. This co... » read more

Bridging The Gap Between RF Front-End Module Characterization And Production Test With The Semiconductor Test System
By NI - 17 Aug, 2016 - Comments: 0

The rapid evolution of wireless connectivity has driven continual consumer thirst for more data throughput and reduced time to market. These pressures have led to modern signaling standards such as 802.11ac and LTE-Advanced, which have placed even more challenging design and test requirements on the most nonlinear and energy-demanding component in the transmitter, the RF power amplifier. The in... » read more

Connected Reliability Concerns
By Ed Sperling - 04 Aug, 2016 - Comments: 0

Ever since the invention of the integrated circuit, the focus has been on improving technology—making it faster, smaller, cheaper, while also cutting the power budget. With the advent of the IoT and ubiquitous connectivity, the value proposition will change. Rather than just improving the chip, the focus will shift to how that chip behaves in context. How does it work in a connected world... » read more

Gaps Emerge In Test Flows
By Ed Sperling - 04 Aug, 2016 - Comments: 0

Gaps are showing up in test flows as chipmakers add more analog content and push into more safety-critical applications, exposing more points at which designs need to be tested as well as weaknesses in current tools and methodologies. The cornerstone of the [getkc id="76" kc_name="IoT"], and connected devices such as self-driving cars, is a heavy reliance on [getkc id="187" kc_name="sensors"... » read more

Executive Insight: Jack Harding
By Ed Sperling - 03 Aug, 2016 - Comments: 0

[getperson id="11145" comment="Jack Harding"], president and CEO of [getentity id="22242" e_name="eSilicon"], sat down with Semiconductor Engineering to talk about consolidation, business relationships, what it will take to survive in the IoT age, and how to better optimize chips. What follows are excerpts of that conversation. SE: We’ve been looking at consolidation for a while and all th... » read more

ISO 26262-Certified Solution For Testing of Safety-Critical Automotive ICs
By Synopsys - 29 Jun, 2016 - Comments: 0

Anti-lock braking systems, air bags, traction control, and electronic stability control are just a few examples of typical safety systems in current production cars. Next-generation safety systems, known as Advanced Driver Assistance Systems, or ADAS, are setting up the path for semi- and fully autonomous cars of the near future. Some ADAS technology uses a combination of cameras and radar to s... » read more

A New Approach For IC Test
By NI - 22 Jun, 2016 - Comments: 0

Since its inception, a founding principle of the semiconductor industry has been to continually improve performance while driving down cost. In other words, offer more for the money. However, amid greater device complexity, shorter product cycles, and relentless cost pressure, the test portion represents an increasing percentage of the total IC cost and a significant part of the product develop... » read more

The Trouble With MEMS
By Ed Sperling - 25 May, 2016 - Comments: 0

The advent of the Internet of Things will open up a slew of new opportunities for MEMS-based sensors, but chipmakers are proceeding cautiously. There are a number of reasons for that restraint. Microelectromechanical systems are difficult to design, manufacture and test, which initially fueled optimism in the MEMS ecosystem that this market would command the same kinds of premiums that analo... » read more

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