A New Approach For IC Test

Leveraging the strength of the PXI platform.


Since its inception, a founding principle of the semiconductor industry has been to continually improve performance while driving down cost. In other words, offer more for the money. However, amid greater device complexity, shorter product cycles, and relentless cost pressure, the test portion represents an increasing percentage of the total IC cost and a significant part of the product development cycle.

This white paper will address:

  • Traditional approaches for IC test;
  • Evolving approaches for better optimization;
  • NI’s platform-based approach to semiconductor test, and
  • Meeting operational requirements while maintaining flexibility.

It also will provide additional links for further information.

To read more, click here.

Leave a Reply

(Note: This name will be displayed publicly)