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A Novel ISO 26262-Compliant Test Bench to Assess the Diagnostic Coverage of Software Hardening Techniques against Digital Components Random Hardware Failures

Researchers propose a fault injection system designed to assess the detection mechanisms implemented by the embedded software, designed to recognize random hardware failures affecting digital components.

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New research paper from Politecnico di Torino.

Abstract:

“This paper describes a novel approach to assess detection mechanisms and their diagnostic coverage, implemented using embedded software, designed to identify random hardware failures affecting digital components. In the literature, many proposals adopting fault injection methods are available, with most of them focusing on transient faults and not considering the functional safety standards requirements. This kind of proposal can benefit developers involved in the automotive market, where strict safety and cost requirements make the adoption of software-only strategies convenient. Hence, we have focused our efforts on compliance with the ISO 26262 automotive functional safety standard. The approach concerns permanent faults affecting microcontrollers and it provides a mapping between the failure mode described in part 11 of the Standard and the chosen fault models. We propose a test bench designed to inject permanent failures into an emulated microcontroller and determine which of them are detected by the embedded software. The main contribution of this paper is a novel fault injection manager integrated with the open-source software GCC, GDB, and QEMU. This test bench manages all the assessment phases, from fault generation to fault injection and the ISA emulation management, up to the classification of the simulation results.”

Find the open access technical paper here. Published March 2022.

Sini, J.; Violante, M.; Tronci, F. A Novel ISO 26262-Compliant Test Bench to Assess the Diagnostic Coverage of Software Hardening Techniques against Digital Components Random Hardware Failures. Electronics 2022, 11, 901. https://doi.org/10.3390/electronics11060901.

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