Author's Latest Posts


Scan Diagnosis


Jayant D’Souza, product manager at Mentor, a Siemens Business, explains the difference between scan test and scan diagnosis, what causes values in a scan test to change, how this can be used to hone in on the actual cause of a failure in a design, and how to utilize test hardware more efficiently. » read more

What Will AI Look Like In 10 Years?


There's no such thing as reverse in AI systems. Once they are let loose, they do what they were programmed to do — optimize results within a given set of parameters. But today there is no consistency for those parameters. There are no standards by which to measure how AI deviates over time. And there is an expectation, at least today, that AI systems will adapt to whatever patterns they di... » read more

Scaling, Packaging, And Partitioning


Prior to the finFET era, most chipmakers either focused on shrinking or packaging, but they rarely did both. Going forward, the two will be inseparable, and that will lead to big challenges with partitioning of data and processing. The key driver here, of course, is that device scaling no longer provides appreciable benefits in power, performance and cost. Nevertheless, scaling does provide ... » read more

Testing Autonomous Vehicles


Jeff Phillips, head of automotive marketing at National Instruments, talks about how to ensure that automotive systems are reliable and safe, how test needs to shift to adapt to continual updates and changes, and why this is particularly challenging in a world where there is no known right answer. » read more

How To Ensure Reliability


Michael Schuldenfrei, corporate technology fellow at OptimalPlus, talks about how to measure quality, why it’s essential to understand all of the possible variables in the testing process, and why outliers are no longer considered sufficient to ensure reliability. » read more

Into The Cold And Darkness


The need for speed is limitless. There is far more data to process, and there is competition on a global scale to process it fastest and most efficiently. But how to achieve future revs of improvements will begin to look very different from the past. For one thing, the new criteria for that speed are frequently tied to a fixed or shrinking power budget. This is why many benchmarks these days... » read more

MLPerf Benchmarks


Geoff Tate, CEO of Flex Logix, talks about the new MLPerf benchmark, what’s missing from the benchmark, and which ones are relevant to edge inferencing. » read more

5 Major Shifts In Automotive


Much of the automotive industry has begun repositioning and retrenching over the past few months, pushing back the projected rollout for fully autonomous vehicles and changing direction on power sources and technology used in the next-generation of electric vehicles. Taken together, these shifts mark a significant departure for traditional automakers, which find themselves playing catch-up t... » read more

Reliability At 5nm And Below


The best way to figure out how a chip or package will age is to bake it in an oven, heat it in a pressure cooker, and stick it in a freezer. Those are all standard methods to accelerate physical effects and the effects of aging, but it's not clear they will continue working as chips shrink to 5nm and 3nm, or as they are included in multi-die packages. Extending any of those kitchen-like appr... » read more

Gaps Emerge In Test And Analytics


Sensor and process drift, increased design complexity, and continued optimization of circuitry throughout its lifetime are driving test and analytics in new directions, requiring a series of base comparisons against which equipment and processes can be measured. In the design world this type of platform is called a digital twin, but in the test world there is no equivalent today. And as more... » read more

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