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Improving Library Characterization Quality And Runtime With Machine Learning


By Megan Marsh and Wei-Lii Tan Today’s semiconductor applications, ranging from advanced sensory applications, IoT, edge computing devices, high performance computing, to dedicated A.I. chips, are constantly pushing the boundaries of attainable power, performance, and area (PPA) metrics. The race to design and ship these innovative devices has resulted in a focused, time-to-market-driven e... » read more