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Debugging Modern SoCs With Embedded Analytics: Instrumentation, Trace, And Faster Root-Cause Isolation


As SoCs chase ever higher performance and power efficiency, their designs have become harder to rootcause and harder to debug. Today’s devices combine billions of transistors with heterogeneous compute blocks and a growing mix of third‑party IPs, so failures can come from anywhere: a corner-case interaction between cores, an integration mistake, a timing assumption that no longer holds, or ... » read more