Author's Latest Posts


A Scalable Answer To Advanced-Node Characterization


If you're working on standard-cell libraries at 28 nm or below, you already know the math isn't in your favor. At the 130 nm node, a typical library had fewer than 100 cells and a handful of PVT corners. Fast-forward to 16/14 nm and beyond, libraries now contain 1,200+ cells across 200+ PVT corners. Every new SoC tape-out demands broader coverage for design robustness, and the characte... » read more