New Challenges In IC Reliability
By Ed Sperling - 15 Oct, 2024 - Comments: 0

Experts at the Table: Semiconductor Engineering sat down to discuss reliability of chips, how it is changing, and where the new challenges are, with Steve Pateras, vice president of marketing and business development at Synopsys; Noam Brousard, vice president of solutions engineering at proteanTecs; Harry Foster, chief verification scientist at Siemens EDA; and Jerome Toublanc, high-tech soluti... » read more

Redefining RAS in Datacenters with Real-Time Health Monitoring
By proteanTecs - 15 Oct, 2024 - Comments: 0

Abstract Hyperscale datacenters require intense computational power for compute-intensive tasks, such as AI, data analytics, machine learning, and big data processing. They leverage parallel processing across multiple computers, in high-density servers, to handle complex tasks efficiently. This uses specialized, powerful processors and training and inference of specific GPUs or ASICs. Such c... » read more

ML Model Usage For Various Life Stages Of Semiconductor Test
By Shinji Hioki - 15 Oct, 2024 - Comments: 0

By Shinji Hioki and Ken Butler From development through high volume manufacturing (HVM), semiconductor manufacturers’ pain points change based on the life stages. Each stage requires different types of applications to help with business needs. At the early stage, where the design and process are still immature, understanding the root causes of maverick material and implementing fixes is th... » read more

Signals In The Noise: Tackling High-Frequency IC Test
By Gregory Haley - 15 Oct, 2024 - Comments: 0

The need for high-frequency semiconductor devices is surging, fueled by growing demand for advanced telecommunications, faster sensors, and increasingly autonomous vehicles. The advent of millimeter-wave communication in 5G and 6G is pushing manufacturers to develop chips capable of handling frequencies that were once considered out of reach. However, while these technologies promise faster ... » read more

Securing Advanced Packaging Supply Chain With Inherent HW Identifiers Using Imaging Techniques
By Technical Paper Link - 14 Oct, 2024 - Comments: 0

A new technical paper titled "Fault-marking: defect-pattern leveraged inherent fingerprinting of advanced IC package with thermoreflectance imaging" was published by researchers at University of Florida and University of Cincinnati. "This work visits the existing challenges and limitations of traditional embedded fingerprinting and watermarking approaches, and proposes the notion of inherent... » read more

UMI: Extending Chiplet Interconnect Standards To Deal With The Memory Wall
By Ramin Farjadrad - 14 Oct, 2024 - Comments: 0

With the Open Compute Project (OCP) Summit upon us, it’s an appropriate time to talk about chiplet interconnect (in fact the 2024 OCP Summit has a whole day dedicated to the multi-die topic, on October 17). Of particular interest is the Bunch of Wires (BoW) interconnect specification that continues to evolve. At OCP there will be an update and working group looking at version 2.1 of BoW. (... » read more

Chip Industry Technical Paper Roundup: Oct. 14
By Linda Christensen - 14 Oct, 2024 - Comments: 0

New technical papers recently added to Semiconductor Engineering’s library: [table id=367 /] More Reading Chip Industry Week In Review AI CPU chiplet platform; Intel-AMD pact; GDDR7 DRAM; AI-RFIC funding; CHIPS Act awards; NoC tiling; thermal modeling on chiplets; $900M nuclear tech and more. Technical Paper Library home » read more

Research Bits: Oct. 14
By Liz Allan - 14 Oct, 2024 - Comments: 0

Si-photonics chip emits beam of light MIT researchers developed a miniature, chip-based “tractor beam” that could help scientists study DNA, classify cells, and investigate the mechanisms of disease. The device uses a beam of light emitted by a silicon-photonics chip to manipulate particles millimeters away from the chip surface, while the sample remains sterile under its glass cover. T... » read more

Improving The Gate Oxide Reliability in Gate First HKMG DRAM Structures (Sungkyunkwan Univ., Samsung)
By Technical Paper Link - 11 Oct, 2024 - Comments: 0

A new technical paper titled "Novel STI Technology for Enhancing Reliability of High-k/Metal Gate DRAM" was published by researchers at Sungkyunkwan University and Samsung Electronics. Abstract: "The challenges associated with semiconductor are increasing because of the rapid changes in the semiconductor market and the extreme scaling of semiconductors, with some processes reaching their te... » read more

PIO on Current HW Outperforms DMA Over a Range of Payload Sizes In A Number of Different Applications (ETH Zurich)
By Technical Paper Link - 11 Oct, 2024 - Comments: 0

A new technical paper titled "Rethinking Programmed I/O for Fast Devices, Cheap Cores, and Coherent Interconnects" was published by researchers at ETH Zurich. Abstract: "Conventional wisdom holds that an efficient interface between an OS running on a CPU and a high-bandwidth I/O device should be based on Direct Memory Access (DMA), descriptor rings, and interrupts: DMA offloads transfers fr... » read more

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