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Ready, Set, Go: Outrunning Moore’s Law With 3D-IC
By Tony Mastroianni - 08 Dec, 2022 - Comments: 0

By Anthony Mastroianni and Gordon Allan, Siemens EDA 3D ICs are an exciting and promising extension of heterogeneous advanced package technology into the third dimension. Although far from mainstream, 3D IC’s time is coming, as chiplet standardization efforts and supporting tool developments begin to make 3D IC practicable and profitable to more players – big and small – and products w... » read more

Are You Paying Proper Attention To Your ESD Design Windows?
By Derong Yan - 10 Nov, 2022 - Comments: 0

Electrostatic discharge (ESD) issues in integrated circuit (IC) chip designs have become more critical at advanced semiconductor process nodes, due to shrinking transistor dimensions and oxide layer thickness [1]. There are many ESD design rules and flows that designers check for common ESD issues, such as topological checks for the existence of ESD protection devices, current density (CD) chec... » read more

Minimizing EM/IR Impacts On IC Design Reliability And Performance
By Joel Mercier - 13 Sep, 2022 - Comments: 0

By Joel Mercier and Karen Chow As technologies and foundry process nodes continue to advance, it gets more difficult to design and verify integrated circuits (ICs). The challenges become even more apparent in 5nm and below nodes, and as the industry moves away from fin field-effect transistor (finFET) and into gate-all-around field-effect transistor (GAAFET) technologies. There are many prob... » read more

Cloud-Ready Circuit Simulation Accelerates SoC Verification
By Nebabie Kebebew - 15 Aug, 2022 - Comments: 0

By Nebabie Kebebew and Nigel Bleasdale Driven by the explosion of big data and expanding applications, chip design complexity is increasing. Applications such as high-performance computing (HPC), the Internet of Things (IoT), automotive, and 5G mobile and communications coupled with advanced process technology nodes require running a large number of circuit simulations to ensure the circuits... » read more

Using ML Methods In Production-Ready Engineering Solutions For IC Verification
By WeiLii Tan - 02 Aug, 2022 - Comments: 0

By WeiLii Tan & Jeff Dyck Semiconductor designs continue to push the envelope of performance, functionality, and efficiency while their application scope expands in high-performance computing, automotive solutions, and IoT devices. The increased design complexity, scale, and mission-critical operations of semiconductor designs mean that IC verification strategies must evolve to cover expon... » read more

Emulation-Centric Power Analysis Of SoC Designs
By Lauro Rizzatti - 09 Jun, 2022 - Comments: 0

Verification expert Lauro Rizzatti recently interviewed Jean-Marie Brunet, senior marketing director, Scalable Verification Solutions Division (SVSD), Siemens EDA, about the importance of accurate power estimation and optimization for system-on-chip (SoC) designs. What is the problem facing the semiconductor industry today regarding pre-silicon power estimation? The problem is the discrep... » read more

What’s In A Name(space)? Optimizing SSD Controller Performance And Verification
By Himani Kaushik - 12 May, 2022 - Comments: 0

Solid state drives (SSDs) have come to the forefront as a promising solution for today and tomorrow’s immense data transfer and storage demands. And SSDs themselves are constantly evolving with upgrades of their critical components to provide higher access speeds. One such component for the NVMe specification is created by the division of non-volatile memory (NVM) into what are commonly known... » read more

Reliable DRC Voltage Text Annotation Means Faster And More Accurate DRC Verification
By Abdellah Bakhali - 14 Apr, 2022 - Comments: 0

As the potential for complex interactions between voltage domains grows significantly with the increase in design density at each new process node, the complexity of spacing checks in design rule checking (DRC) also increases. To minimize these types of risk, many simple spacing checks have evolved to become voltage-aware DRC (VA-DRC) checks that incorporate voltage values to determine the requ... » read more

Shifting The Design Paradigm To Improve Verification Efficiency
By Harry Foster - 10 Mar, 2022 - Comments: 0

We are in the midst of a verification crisis manifested by a growing gap between verification efficiency and effectiveness. This crisis cannot be solved through improvements in verification methodologies and techniques alone. Indeed, it requires a philosophical change in the way we approach design, with an emphasis on bug prevention. We refer to this fundamental change as design using intent-fo... » read more

Context-Aware SPICE Simulation Improves The Fidelity Of ESD Analysis
By Neel Natekar - 10 Feb, 2022 - Comments: 0

Electrostatic discharge (ESD) is a major reliability concern for integrated circuit (IC) designs. ESD verification is proving to be a significant challenge at advanced nodes, due to growing IC design complexity and transistor counts. Traditional ESD verification approaches using parasitic extraction followed by SPICE simulation are deficient in providing simulation results in a practical runtim... » read more

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