category: Blogs – MD

category: IoT, Security & Automotive

What’s Next For MEMS
By SEMI - 15 May, 2014 - Comments: 0

By Paula Doe While MEMS sensors and actuators are key to enabling most of the high profile markets of tomorrow, from wearables to smart objects in the Internet of Things, MEMS companies face challenges today in transitioning to those new opportunities as basic MEMS devices increasingly becoming commodities. Large corporations are hiring their own in-house MEMS engineers, as standard platforms ... » read more

3D Printing Revolution Ahead
By Adrienne Downey - 15 May, 2014 - Comments: 0

The 3D printing industry has been getting loads of press recently. It has captured the imagination of many, with the possibility of starting a manufacturing revolution. New applications and materials are announced on a (very) frequent basis. ColorFabb will beta test two new filament materials, one based on bronze and the other bamboo, in the coming months. NASA and Tethers Unlimited are deve... » read more

Self-Aligned Double Patterning, Part One
By David Abercrombie - 15 May, 2014 - Comments: 0

I’m sure most of you have seen a Rorschach test ink blot (Figure 1). Psychiatrists ask the subjects to tell them what they “see” in the ink blot. The answers are used to characterize the respondent’s personality and emotional functioning. I am never sure if I would feel more uncertain being the psychiatrist asking the question, or the subject trying to decide what to say, given there ar... » read more

Beyond Moore’s Law
By Michael Watts - 15 May, 2014 - Comments: 0

What do you make of all the different reports coming out of Advanced Lithography 2014 — the end of Moore's Law, continued problems with EUV, directed self-assembly assembly makes progress? An equipment insider, whose judgment I value, came back from the meeting and concluded, "We will see the end of Moore’s Law shrinks in 2020. After that, no one knows!” There is no way a $300B+ business ... » read more

Stopping Mask Hotspots Before They Escape The Mask Shop
By eBeam Initiative - 28 Apr, 2014 - Comments: 3

By Aki Fujimura The same types of physics-based issues that have haunted lithography for decades have started to impact mask writing as well. The increasingly small and complex mask shapes specified by optical proximity correction (OPC) that are now required for faithful wafer lithography at 28nm-and-below nodes have given rise to an increase in mask hotspots. Mask hotspots occur when the shap... » read more

Mask Issues Ahead
By eBeam Initiative - 17 Apr, 2014 - Comments: 0

It's not just the lithography that's getting complicated. Check out this video by Dai Nippon Printing's Naoya Hayashi. [youtube vid=a6WmvhTdEv4] » read more

Living On The Edge
By Ed Sperling - 17 Apr, 2014 - Comments: 0

Looking around the globe at the big foundries these days, many of them are in danger zones—geopolitical, seismological, or areas that have been the incubators for public health disasters in recent years. This is one of the risks of a global supply chain, and it’s one that should cause ulcers for any supply chain management executive. South Korea’s Samsung is within a short missile laun... » read more

IoT Roadblocks: Speed Bumps Or Major Road Closure?
By Joanne Itow - 17 Apr, 2014 - Comments: 0

The Internet of Things promises to be a big volume market and continues to grab headlines as companies race forward to prepare for its highly anticipated exponential growth. Huge market size numbers are being tossed around in every article and presentation. But when will the IoT really make an impact and what will it look like? Are we setting ourselves up for a false start? The technology fo... » read more

Searching For Rare Earths
By Mark LaPedus - 17 Apr, 2014 - Comments: 2

The semiconductor industry is pre-occupied with several and expensive technologies at once. One the device side, the industry is looking at new chip architectures, such as 3D NAND, finFETs and stacked die. On the manufacturing front, there is 450mm technology, next-generation lithography (NGL) and new materials. And that’s just the tip of the iceberg. Another technology that deserve... » read more

Getting A Clearer Picture
By Geir Eide - 17 Apr, 2014 - Comments: 1

Scan test diagnosis is an established software-based methodology for localizing defects causing failures in digital semiconductor devices. Using structural test patterns (such as ATPG) and the design description, diagnosis turns failing test cycles into valuable data. Exactly how valuable this data is depends on the quality of the diagnosis results. A result that points to a small group of nets... » read more

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