Leverage Functional Interfaces For High-Speed Test Access During All Phases Of The Silicon Lifecycle


Chip testing used to be straightforward. The development team used fault simulation to select a subset of the functional tests that could detect most possible manufacturing faults. These were translated to test patterns that ran on automated test equipment (ATE) to screen out defective dies at wafer test and bad packaged chips in final test. Lots of new technology was introduced over time, incl... » read more

Enabling SoC Visibility For Future Secure Hardware Architectures With In-Chip Environmental Monitoring


Billions of people around the world are now online and generating vast amounts of data every day. This data revolution, which is largely driven by user performance requirements, is a double-edged sword. On one hand it is enabling huge technology advancements, revolutionizing the way we connect with each other and the world around us, but on the other hand it is exposing major vulnerabilities in... » read more

Closing The Post-Silicon Timing Analysis Gap


Accurate static timing analysis is one of the most important steps in the development of advanced node semiconductor devices. Performance numbers are included in chip and system specifications from the earliest marketing requirements. The architects and designers carefully determine clock cycle times that can achieve the required performance using the chosen high-level architecture, micro-archi... » read more

Choosing The Right Server Interface Architectures For High Performance Computing


The largest bulk and cost of a modern high-performance computing (HPC) installation involves the acquisition or provisioning of many identical systems, interconnected by one or more networks, typically Ethernet and/or InfiniBand. Most HPC experts know that there are many choices between different server manufacturers and the options of form factor, CPU, RAM configuration, out of band management... » read more

A Practical Approach To DFT For Large SoCs And AI Architectures, Part II


By Rahul Singhal and Giri Podichetty Part I of this article discusses the design-for-test (DFT) challenges of AI designs and strategies to address them at the die level. This part focuses on the test requirements of AI chips that integrate multiple dies and memories on the same package. Why 2.5D/3D chiplet-based designs for AI SoCs? Many semiconductor companies are adopting chiplet-based d... » read more

Is A Guestimate Good Enough For Obtaining Failure Mode Distribution?


SoCs targeting automotive applications are required to meet certain safety and quality standards as described in ISO 26262. A quantitative approach to safety analysis involves performing Failure Mode Effects and Diagnostic Analysis (FMEDA). FMEDA is a systematic quantitative analysis technique to obtain subsystem/product level failure rates, failure modes and diagnostic capabilities of systemat... » read more

A Practical Approach To DFT For Large SoCs And AI Architectures, Part I


The traditional processors designed for general-purpose applications struggle to meet the computing demands and power budgets of artificial intelligence (AI) or machine leaning (ML) applications. Several semiconductor design companies are now developing dedicated AI/ML accelerators that are optimized for specific workloads such that they deliver much higher processing capabilities with much low... » read more

Optimizing System Performance At Runtime


Silicon lifecycle management (SLM) is one of the hottest emerging topics in the semiconductor industry. Chip and system developers face relentless demands for ever greater performance, reliability, functional safety, and security along with lower power consumption and silicon cost. Key applications driving these demands include data centers, autonomous vehicles, complex consumer devices such as... » read more

Expanding Silicon Lifecycle Management To Real-Time System Performance Optimization


Semiconductor development is currently in one of its periodic crises, with many factors combining to require dramatically new technologies and methodologies. Chips continue to grow ever larger and more complex, with 3D IC devices adding another layer of challenges. Huge data centers, autonomous vehicles, and algorithms using artificial intelligence (AI) and machine learning (ML) drive a relentl... » read more

Don’t Let X Be A Problem For Logic BIST


By Rahul Singhal and Giri Podichetty A failure in the operation of integrated circuits (ICs) or chips deployed in safety-critical applications such as automotive, medical, and aerospace could have catastrophic consequences. These failures could stem from defects in the chip that escaped manufacturing tests or from transient faults that can occur during system operation due to factors such as... » read more

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