category: Test, Measurement and Analytics

category: IoT, Security & Automotive

Overcoming The Challenges Of Verifying Multi-Die Systems
By Synopsys - 12 Mar, 2024 - Comments: 0

Despite clear advantages of multi-die systems, the decision to design a multi-die system rather than a traditional monolithic SoC is not easy. There are numerous new challenges that stand in the way of multi-die system realization. This white paper focuses on the verification challenges of multi-die systems, including: Addressing capacity and performance for system verification Valid... » read more

MIMO Application Framework
By NI - 12 Mar, 2024 - Comments: 0

Massive MIMO is an exciting area of 5G wireless research. For next-generation wireless data networks, it promises significant gains that offer the ability to accommodate more users at higher data rates with better reliability while consuming less power. Using the NI Massive MIMO Software Architecture, researchers can build Massive MIMO testbeds to rapidly prototype large-scale antenna systems u... » read more

Application-Specific Power Performance Optimizer Based On Chip Telemetry
By proteanTecs - 12 Mar, 2024 - Comments: 0

As datacenter power consumption continues to pose cooling and cost challenges, and battery driven devices are expected to last longer between charges, the search for advanced power management mechanisms continues. A modern design must balance between maximizing performance, consuming the least amount of power, and guaranteeing no failures in field. The latter requires safety margins which tr... » read more

Using OCD To Measure Trench Structures In SiC Power Devices
By Nick Keller - 08 Feb, 2024 - Comments: 0

You don’t have to be a dedicated follower of the transportation industry to know it is in the early stages of a significant transition, away from the rumbling internal combustion engine to the quiet days of electric vehicles. The signs of this transition are right there on the streets in the form of electric-powered buses, bikes and cars. The road to our electric future is before us, but we w... » read more

Adaptive Test Ramps For Data Intelligence Era
By Laura Peters - 08 Feb, 2024 - Comments: 0

Widely available and nearly unlimited compute resources, coupled with the availability of sophisticated algorithms, are opening the door to adaptive testing. But the speed at which this testing approach is adopted will continue to vary due to persistent concerns about data sharing and the potential for IP theft and data leakage. Adaptive testing is all about making timely changes to a test p... » read more

Hidden Costs And Tradeoffs In IC Quality
By Gregory Haley - 08 Feb, 2024 - Comments: 0

Balancing reliability against cost is becoming more difficult for semiconductor test, as chip complexity increases and devices become more domain-specific. Tests need to be efficient and effective without breaking the bank, while also ensuring chips are of sufficient quality for their specific application. The problem is that every new IC device adds its own set of challenges, from smaller f... » read more

Bridging The Connectivity Gap: Unraveling The Complexities Of Wireless Standard Deployments
By Alejandro Escobar Calderon - 08 Feb, 2024 - Comments: 0

By Alejandro Escobar Calderon and John Ye In the fast-paced world of technological evolution, the deployment of wireless standards has been touted as the gateway to a connected future. The promise of lightning-fast wireless connectivity has been a driving force behind the relentless pursuit of cutting-edge standards such as 4G, 5G, and new network architectures like Open RAN (O-RAN). However... » read more

True Zero Trust Combats IC Manufacturing Security Challenges
By Michael Chang - 08 Feb, 2024 - Comments: 0

The semiconductor manufacturing industry is facing a host of unprecedented technology and security challenges. A common catchphrase these days is that “data is the new oil.” Data is everywhere, in everything we do, and there is both good and bad associated with this trend. Data everywhere creates new security issues that need to be addressed to protect the integrity of your information and ... » read more

AI-Driven Test Optimization Solves Semiconductor Test Costs And Design Schedules
By Sri Ganta - 08 Feb, 2024 - Comments: 0

Artificial Intelligence has become a pervasive technology that is being applied to solve today’s complex problems, especially in the areas involving exponentially large amounts of data, their analysis, and corresponding decision making that are otherwise limited by human abilities. Therefore, complex challenges in semiconductor design, test and manufacturing are a perfect match for AI. The... » read more

FTIR On Earth, Mercury In Focus
By Xia Stammer - 08 Feb, 2024 - Comments: 0

On early hours on 19th October 2018 at Guiana Space Centre in Kourou in French Guiana an Ariane 5 rocket successfully launched the BepiColombo mission. It started its 7 years journey to Mercury. The joined mission of the European Space Agency (ESA) and the Japan Aerospace Exploration Agency (JAXA) was named in honor of Giuseppe “Bepi” Colombo, an Italian scientist who studied Mercury and fi... » read more

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