category: Top Stories

category: IoT, Security & Automotive

How To Integrate An Embedded FPGA
By Brian Bailey - 30 May, 2019 - Comments: 1

Choosing to add programmable logic into an SoC with an eFPGA is just the beginning. Other choices follow involving how many lookup tables (LUTs), how much routing and what topology, how will data be transferred in and out of the fabric, does data need to be coherent with system memory, how will it be programmed and tested, and what RTL functions need to be embedded into the programmable fabric ... » read more

Why IP Quality Is So Difficult To Determine
By Ann Mutschler - 30 May, 2019 - Comments: 0

Differentiating good IP from mediocre or bad IP is getting more difficult, in part because it depends up on how and where it is used and in part because even the best IP may work better in one system than another—even in chips developed by the same vendor. This has been one of the challenges with IP over the years. In many cases, IP is poorly characterized, regardless of whether that IP wa... » read more

Adding Order And Structure To Verification
By Brian Bailey - 30 May, 2019 - Comments: 0

You can't improve what you can't measure, and when it comes to methodologies the notion of measurement becomes more difficult. Add in notions of the skills, capabilities and experience levels of individuals within an organization, which may affect their ability to adopt certain technologies, and it requires considerable attention. This is where concepts such as capability maturity models (CM... » read more

MicroLEDs: The Next Revolution In Displays?
By Mark LaPedus - 29 May, 2019 - Comments: 1

Flat-panel display technology is exploding on several fronts as more screens are required for more devices. But one type of display is generating an enormous amount of buzz in the market—microLEDs. Dozens of companies are working on micro-light emitting diodes (microLEDs), a technology that promises to provide better and brighter displays than current solutions in the market. Apple, Facebo... » read more

SiC Demand Growing Faster Than Supply
By Mark LaPedus - 23 May, 2019 - Comments: 2

The silicon carbide (SiC) industry is in the midst of a major expansion campaign, but suppliers are struggling to meet potential demand for SiC power devices and wafers in the market. In just one example of the expansion efforts, Cree plans to invest up to $1 billion to increase its SiC fab and wafer capacities. As part of the plan, Cree is developing the world’s first 200mm (8-inch) SiC f... » read more

Partitioning In 3D
By Katherine Derbyshire - 23 May, 2019 - Comments: 2

The best way to improve transistor density isn't necessarily to cram more of them onto a single die. Moore’s Law in its original form stated that device density doubles about every two years while cost remains constant. It relied on the observation that the cost of a processed silicon wafer remained constant regardless of the number of devices printed on it, which in turn depended on litho... » read more

3D NAND Race Faces Huge Tech And Cost Challenges
By Mark LaPedus - 23 May, 2019 - Comments: 8

Amid the ongoing memory downturn, 3D NAND suppliers continue to race each other to the next technology generations with several challenges and a possible shakeout ahead. Micron, Samsung, SK Hynix and the Toshiba-Western Digital duo are developing 3D NAND products at the next nodes on the roadmap, but the status of two others, Intel and China’s Yangtze Memory Technologies Co. (YMTC), is les... » read more

Controlling Variability And Cost At 3nm And Beyond
By Ed Sperling - 22 May, 2019 - Comments: 1

Richard Gottscho, executive vice president and CTO of Lam Research, sat down with Semiconductor Engineering to talk about how to utilize more data from sensors in manufacturing equipment, the migration to new process nodes, and advancements in ALE and materials that could have a big impact on controlling costs. What follows are excerpts of that conversation. SE: As more sensors are added int... » read more

Evolution Of Verification Engineers
By Brian Bailey - 22 May, 2019 - Comments: 0

Semiconductor Engineering sat down to discuss the implications of having an executable specification that drives verification with Hagai Arbel, chief executive officer for VTool; Adnan Hamid, chief executive office for Breker Verification; Mark Olen, product marketing manager for Mentor, a Siemens Business; Jim Hogan, managing partner of Vista Ventures; Sharon Rosenberg, senior solutions archit... » read more

In-Chip Monitoring Becoming Essential Below 10nm
By Ann Mutschler - 20 May, 2019 - Comments: 0

Rising systemic complexity and more potential interactions in heterogeneous designs is making it much more difficult to ensure a chip, or even a block within a chip, will functioning properly without actually monitoring that behavior in real-time. Continuous and sporadic monitoring have been creeping into designs for the past couple of decades. But it hasn’t always been clear how effective... » read more

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