Using Digital Twins And DL In Lithography


Leo Pang, chief product officer and executive vice president at D2S, looks at the results of inverse lithography technology at advanced nodes using curvilinear patterns, and how that can be combined with a digital twin and deep learning speed up time to market and reduce cost. » read more

Curvilinear Full-Chip ILT


Leo Pang, chief product officer and executive vice president at D2S, talks about the speed improvements with full-chip inverse lithography technology, why it is so critical in stitching together large chips, and how this approach differs from traditional litho approaches. » read more

Manufacturing Printed Sensors


Vijaya Kayastha, lead device development engineer at Brewer Sciences, talks about the different approaches for different printed sensors, why each of those requires different skill levels for scaling up the process, and why this technology will be so important for industrial and IoT applications. » read more

Process Window Optimization


David Fried, vice president of computational products at Lam Research, examines increasing process variation and interactions between various types of variation, why different approaches are necessary to improve yield and continue scaling. » read more

Material Choices In Printed Temperature Sensors


Vijaya Kayastha, lead device development engineer at Brewer Science, talks about what’s needed for printed temperature sensors, what happens when there are impurities in the materials, how these sensors respond to stress, and how costs compare to traditional sensors. » read more

Changes In Smart Manufacturing


Tom Salmon, vice president of collaborative technology platforms at SEMI, talks with Semiconductor Engineering about what’s changing in smart manufacturing, the impact of more data and AI, what the ROI looks like for these kinds of investments, and how that affects overall equipment efficiency. While the biggest bang will come from advanced nodes, it also is targeted at advanced packaging. » read more

Advanced Process Control


David Fried, vice president of computational products at Lam Research, looks at shrinking tolerances at advanced processes, how that affects variation in semiconductor manufacturing, and what can be done to achieve the benefits of scaling without moving to new transistor architectures. » read more

Smart Manufacturing


Tom Salmon, vice president of collaborative technology platforms at SEMI, talks about smart manufacturing, and the role of AI, smart gateways, and digital twins. https://youtu.be/e9DQ_Xfc2K0     See other tech talk videos here.   » read more

The Case For Chiplets


Kandou’s Amin Shokrollahi looks at what’s behind the momentum for a LEGO-like approach, where the challenges are, and how the cost compares with other approaches. https://youtu.be/7QHEeagdLzk     ___________________________________ Find more tech talk videos here .   » read more

Variation At 10/7nm


Klaus Schuegraf, vice president of new products and solutions at PDF Solutions, explains why variability is a growing challenge at advanced nodes, why middle of line is now one of the big problem areas, and what happens when a via is misaligned due to a small process variation. https://youtu.be/jQfggOnxZJQ » read more

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