category: Videos

category: IoT, Security & Automotive

Coding And Debugging RISC-V
By Ann Mutschler - 06 Nov, 2023 - Comments: 0

As monolithic device scaling continues to wind down and evolve toward increasingly heterogeneous designs, it has created an inflection point for chip architects to create customized cores that are much more energy efficient and faster than off-the-shelf processors. Zdeněk Přikryl, CTO of Codasip, talks about where RISC-V fits into this picture, using a modular ISA and custom instruction layer... » read more

DSP Techniques For High-Speed SerDes
By Ed Sperling - 23 Oct, 2023 - Comments: 0

Sensors everywhere, more connected devices, and the rollout of smart everything has created a flood of data. The question now is how to best handle all of that data, where to process it, and how to move it locally and to the outside network. Madhumita Sanyal, technical product manager at Synopsys, talks about the need for continuous performance improvements in SerDes, PCIe, NRZ, and PAM4, and w... » read more

Memory And High-Speed Digital Design
By Ann Mutschler - 18 Oct, 2023 - Comments: 0

As DRAM gets faster, timing constraints, jitter, and signal integrity become harder to control. The real challenge is to understand what can go wrong early in the design process, and that becomes more complex with each new version of memory and higher signal speeds. Stephen Slater, product manager for EDA products at Keysight, talks about how simulation can be applied to these issues, what to t... » read more

Verifying A RISC-V Processor
By Ed Sperling - 17 Oct, 2023 - Comments: 0

Verifying an SoC is very different than verifying a processor due to the huge state space in the processor. In addition to the tools needed for an SoC, additional tools are required for a step and compare environment. Larry Lapides, vice president at Imperas, talks about the need to verify asynchronous events like interrupts, how to compare a reference model to RTL, and the need for both hardwa... » read more

Issues In Calculating Glitch Power
By Ed Sperling - 11 Oct, 2023 - Comments: 0

The amount of power consumed by redundant non-functional toggles, or glitch power, can be as high as 35% of total power consumption in a design. What can be done about that? Godwin Maben, low-power architect and scientist at Synopsys, takes a deep dive into the causes of glitch, how it is affected by new process nodes and heterogeneous integration, and the impact of different workloads, higher ... » read more

Die-To-Die Security
By Ed Sperling - 02 Oct, 2023 - Comments: 0

Security concerns are growing as more chiplets or die are added into a package. There are more possible attack points, and data is becoming increasingly valuable, which makes a successful attack much more lucrative than in the past. Mike Borza, Synopsys scientist, talks about the impact of heterogeneous integration on security, what the risks are for multi-tenant data centers, and what happens ... » read more

Application-Optimized Processors
By Ed Sperling - 29 Sep, 2023 - Comments: 0

Executing a neural network on top of an NPU requires an understanding of application requirements, such as latency and throughput, as well as the potential partitioning challenges. Sharad Chole, chief scientist and co-founder of Expedera, talks about fine-grained dependencies, why processing packets out of order can help optimize performance and power, and when to use voltage and frequency scal... » read more

Challenges Of Testing Advanced Packages
By Ed Sperling - 19 Sep, 2023 - Comments: 0

The number of things that can wrong in assembly and test increases as more chips are added into a package. Testing is the usual guarantor of a reliable device, but in an advanced package there are all sorts of new issues — more contacts, different handling requirements, the necessary thermal conditions for test, and variation within the package. George Harris, vice president of global test se... » read more

Challenges In Ramping New Manufacturing Processes
By Ed Sperling - 30 Aug, 2023 - Comments: 0

Despite a slowdown for Moore’s Law, there are more new manufacturing processes rolling out faster than ever before. The challenge now is to decrease time to yield, which involves everything from TCAD and design technology co-optimization, to refinement of power, performance, area/cost, and process control and analytics. Srinivas Raghvendra, vice president of engineering at Synopsys, talks abo... » read more

Manual X-ray Inspection
By Ed Sperling - 28 Aug, 2023 - Comments: 0

Increased density in advanced node chips and advanced packaging offers a way to greatly improve performance and reduce power, but it also makes it harder to inspect these devices for real and latent defects. Higher density can lead to scattering of light, and heterogeneous integration in a package means it’s not always possible to see through all materials equally. Chris Rand, product line ma... » read more

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