Chip Industry Technical Paper Roundup: Apr. 7

Benchmarking ultra-low-power μNPUs; pSRAM bitcell for high-speed; connected vehicles security; HW security verification; contact layer attributes; RISC-V cache architecture; multi-die floorplanning.

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New technical papers recently added to Semiconductor Engineering’s library:

Technical Paper Research Organizations
Benchmarking Ultra-Low-Power μNPUs Imperial College London and University of Cambridge
Security Risks and Designs in the Connected Vehicle Ecosystem: In-Vehicle and Edge Platforms Università di Pisa, Ford Motor Company, MIT, and the Institute of Informatics and Telematics
PPAC Driven Multi-die and Multi-technology Floorplanning Texas A&M University and Duke University
ThreatLens: LLM-guided Threat Modeling and Test Plan Generation for Hardware Security Verification University of Florida
Thermal Slip Length at a Liquid/Solid Interface: Power Law Relations From Spatial and Frequency Attributes of the Contact Layer Caltech, T. J. Watson Sr. Lab of Applied Physics
Design of Energy-Efficient Cross-coupled Differential Photonic-SRAM (pSRAM) Bitcell for High-Speed On-Chip Photonic Memory and Compute Systems University of Wisconsin–Madison, USC and GlobalFoundries
ARCANE: Adaptive RISC-V Cache Architecture for Near-memory Extensions Politecnico di Torino and EPFL

Find more semiconductor research papers here.



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