Chip Industry Technical Paper Roundup: Jan. 7

Processing-in-DRAM; co-packaged optics; SOT-MRAM development; efficient wearables; open-source heterogeneous SoCs for AI; Cu–Cu bonding reliability; multifunctional 2D FETs; wafer defect classification.

popularity

New technical papers recently added to Semiconductor Engineering’s library:

Find all technical papers here.



Leave a Reply


(Note: This name will be displayed publicly)