tag: 2.5D

2.5D Surprises And Alternatives
By Ed Sperling - 20 Oct, 2016 - Comments: 0

Semiconductor Engineering sat to discuss advanced packaging issues with Juan Rey, senior director of engineering for Calibre at [getentity id="22017" e_name="Mentor Graphics"]; Max Min, senior technical manager at [getentity id="22865" e_name="Samsung"]; and Lisa Minwell, [getentity id="22242" e_name="eSilicon's"] senior director of IP marketing. What follows are excerpts of that conversation. ... » read more

Lower Power Plus Better Performance
By Ed Sperling - 13 Oct, 2016 - Comments: 0

The tradeoff between power and performance is becoming less about one versus the other, and more about a dual benefit, as new computing and chip architectures begin rolling out. Neural networking, which is one of the hot buttons for any system that relies on lots of distributed sensors, is essential to get a true picture of what is happening around a car moving down the highway at 65 miles ... » read more

Why Do You Need Chip-Package-System Co-Design And Co-Analysis?
By Youngsoo Lee - 13 Oct, 2016 - Comments: 0

Whether it is the need for sustainable energy, or driving performance while keeping power at bay, or enabling safe and reliable operation of any electronic system, containment of electronic noise — power and signal noise is critical to all of the above. Other factors that impact safe and reliable operation are electromigration (EM), electromagnetic interference (EMI) and mechanical stress ena... » read more

Building Chips That Can Learn
By Ed Sperling - 29 Sep, 2016 - Comments: 0

The idea that devices can learn optimal behavior rather than relying on more generalized hardware and software is driving a resurgence in artificial intelligence, machine leaning, and cognitive computing. But architecting, building and testing these kinds of systems will require broad changes that ultimately could impact the entire semiconductor ecosystem. Many of these changes are wel... » read more

Gaps In The Verification Flow
By Brian Bailey - 29 Sep, 2016 - Comments: 0

Semiconductor Engineering sat down to discuss the state of the functional verification flow with Stephen Bailey, director of emerging companies at [getentity id="22017" e_name="Mentor Graphics"]; [getperson id="11079" comment="Anupam Bakshi"], CEO of [getentity id="22168" e_name="Agnisys"]; [getperson id="11124" comment="Mike Bartley"], CEO of [getentity id="22868" e_name="Test and Verification... » read more

Packaging Wars Begin
By Mark LaPedus - 26 Sep, 2016 - Comments: 1

The advanced IC-packaging market is turning into a high-stakes competitive battleground, as vendors ramp up the next wave of [getkc id="82" kc_name="2.5D"]/[getkc id="42" kc_name="3D"] technologies, high-density fan-out packages and others. At one time, the outsourced semiconductor assembly and test ([getkc id="83" comment="OSAT"]) vendors dominated and handled the chip-packaging requirement... » read more

Stacked Die Changes
By Ed Sperling - 21 Sep, 2016 - Comments: 0

Semiconductor Engineering sat down to discuss advanced packaging with David Pan, associate professor in the department of electrical and computer engineering at the University of Texas; Max Min, senior technical manager at [getentity id="22865" e_name="Samsung"]; John Hunt, senior director of engineering at ASE; and Sitaram Arkalgud, vice president of 3D portfolio and technologies at Invensas. ... » read more

Stacked Die Changes
By Ed Sperling - 15 Sep, 2016 - Comments: 1

Semiconductor Engineering sat down to discuss advanced packaging with David Pan, associate professor in the department of electrical and computer engineering at the University of Texas; Max Min, senior technical manager at [getentity id="22865" e_name="Samsung"]; John Hunt, senior director of engineering at ASE; and Sitaram Arkalgud, vice president of 3D portfolio and technologies at Invensas. ... » read more

Noise Killed My Chip
By Brian Bailey - 08 Sep, 2016 - Comments: 0

In the past, noise was considered an annoyance, especially for analog circuitry. But today chips are actually failing because insufficient analysis was performed. Noise types that used to be second-order effects are becoming primary factors that have to be considered. This is happening at the same time that noise margins are getting smaller, both in the amplitude and temporal dimensions. It ... » read more

Putting Design Back Into DFT
By Brian Bailey - 25 Aug, 2016 - Comments: 0

Test always has been a delicate balance between cost and quality, but there are several changes happening in the industry that might cause a significant alteration in strategy. Part one of this two part series about [getkc id="47" comment="Design for Test (DFT)"] looked at changes in areas such as automotive, where built in self-test is becoming a mandated part of the design process. This co... » read more

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