tag: 3D-IC

The Impact Of Multiphysics On Production Electronic Design
By Marc Swinnen - 09 Sep, 2021 - Comments: 0

For many electronic design professionals, it has become clear that the industry is transitioning through an inflection point that is shifting some of the ground rules of design. The increase in the speed and integration density in today’s systems are blurring the lines between chip design and traditional board or system design. This finds its fullest expression in multi-die, 3D integrated ... » read more

New Approaches For Processor Architectures
By Ed Sperling - 26 Aug, 2021 - Comments: 0

Processor vendors are starting to emphasize microarchitectural improvements and data movement over process node scaling, setting the stage for much bigger performance gains in devices that narrowly target what end users are trying to accomplish. The changes are a recognition that domain specificity, and the ability to adjust or adapt designs to unique workloads, are now the best way to impro... » read more

Inside Intel’s Ambitious Roadmap
By Mark LaPedus and Ed Sperling - 23 Aug, 2021 - Comments: 2

Ann Kelleher, senior vice president and general manager of Technology Development at Intel, sat down with Semiconductor Engineering to talk about the company’s new logic roadmap, as well as lithography, packaging, and process technology. What follows are excerpts of that discussion. SE: Intel recently disclosed its new logic roadmap. Beyond Intel 3, the company is working on Intel 20A. Wit... » read more

Angstrom-Level Measurements With AFMs
By Mark LaPedus - 19 Aug, 2021 - Comments: 0

Competition is heating up in the atomic force microscopy (AFM) market, where several vendors are shipping new AFM systems that address various metrology challenges in packaging, semiconductors and other fields. AFM, a small but growing field that has been under the radar, involves a standalone system that provides surface measurements on structures down to the angstrom level. (1 angstrom = 0... » read more

Now You Can Automate Latch-Up Verification For 2.5/3D Technologies
By Dina Medhat - 12 Aug, 2021 - Comments: 0

Latch-up is modeled as a short circuit (low-impedance path) that can occur in an integrated circuit (IC). It may lead to destruction due to over-current resulting from interactions between parasitic devices (PNP and NPN). To protect against latch-up conditions, there are two key types of latch-up design rules—fundamental and advanced [1,2]. Fundamental rules are the local latch-up design r... » read more

2.5D And 3D-IC Latch-Up Prevention
By Siemens EDA - 11 Aug, 2021 - Comments: 0

2.5D/3D ICs have evolved into an innovative solution for many design and integration situations, but they present unique verification obstacles that challenge electronic design automation (EDA) tools originally designed for 2D ICs. Automated solutions are needed not only to reduce verification cycles but also to improve the quality and reliability of package designs. Automated verification o... » read more

Piecing Together Chiplets
By Mark LaPedus - 22 Jul, 2021 - Comments: 3

Several companies are implementing the chiplet model as a means to develop next-generation 3D-like chip designs, but this methodology still has a long way to go before it becomes mainstream for the rest of the industry. It takes several pieces to bring up a 3D chip design using the chiplet model. A few large players have the pieces, though most are proprietary. Others are missing some key co... » read more

New Power, Performance Options At The Edge
By Heidi Elliott - 21 Jul, 2021 - Comments: 0

Increasing compute intelligence at the edge is forcing chip architects to rethink how computing gets partitioned and prioritized, and what kinds of processing elements and memory configurations work best for a particular application. Sending raw data to the cloud for processing is both time- and resource-intensive, and it's often unnecessary because most of the data collected by a growing nu... » read more

Bumps Vs. Hybrid Bonding For Advanced Packaging
By Mark LaPedus - 23 Jun, 2021 - Comments: 3

Advanced packaging continues to gain steam, but now customers must decide whether to design their next high-end packages using existing interconnect schemes or move to a next-generation, higher-density technology called copper hybrid bonding. The decision is far from simple, and in some cases both technologies may be used. Each technology adds new capabilities in next-generation advanced pac... » read more

Thermal Floorplanning For Chips
By Brian Bailey - 10 Jun, 2021 - Comments: 0

Heat management is becoming crucial to an increasing number of chips, and it's one of a growing number of interconnected factors that must be considered throughout the entire development flow. At the same time, design requirements are exacerbating thermal problems. Those designs either have to increase margins or become more intelligent about the way heat is generated, distributed, and dissi... » read more

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