tag: DFT

Week In Review: Design, Low Power
By Jesse Allen - 06 Nov, 2020 - Comments: 0

Tools Mentor unveiled Tessent Streaming Scan Network software for its Tessent TestKompress software. The new solution includes embedded infrastructure and automation that decouples core-level DFT requirements from the chip-level test delivery resources for a simplified bottom-up DFT flow. The bus-based scan data distribution architecture enables simultaneous testing of any number of cores and ... » read more

Scramble For The White Space
By Bryon Moyer - 13 Oct, 2020 - Comments: 0

Chipmakers are pushing to utilize more of the unused portion of a design for different functions, reducing margin in the rest of the chip to more clearly define that white space. White space typically is used to relieve back-end routing congestion before all of the silicon area is used up. But a significant amount of space still remain unused. That provides an opportunity for inserting monit... » read more

Using Critical Area To Boost Automotive IC Test Quality
By Ron Press - 03 Sep, 2020 - Comments: 0

To compete in the fast-growing market for automotive ICs, semiconductor companies need to address new challenges across the entire design flow. To meet the ISO 26262 goal of zero defective parts per million (DPPM), DFT engineers have embraced new test pattern types, including cell-aware, interconnect, and inter-cell bridge (cell neighborhood). But the traditional methods of choosing the types o... » read more

Critical Area-Based Test Pattern Optimization For High-Quality Test
By Mentor, a Siemens Business - 02 Sep, 2020 - Comments: 0

Among the challenges for DFT engineers is how to set a target metric for ATPG and how to choose the best set of patterns. Traditional coverage targets based on the number of faults detected doesn’t consider the likelihood of one fault occurring compared to another. Tessent developed total critical area ATPG technology that enables the sorting and ordering of patterns based on their likelihood... » read more

Test Is Becoming A Horizontal Process
By Ed Sperling - 10 Mar, 2020 - Comments: 3

Semiconductor test, once a discrete part of a well-orchestrated series of manufacturing steps, is looking more like a process that extends from the early concept stage in design to the end of life of whatever system that chip ultimately is used for. This has important ramifications for safety-critical markets in general, and the semiconductor industry in particular. Both worlds have been inc... » read more

AI Chip DFT Techniques For Aggressive Time-To-Market
By Mentor, a Siemens Business - 10 Mar, 2020 - Comments: 0

AI chips have aggressive time-to-market goals. Designers can shave significant time off of DFT and silicon bring up using the techniques described in this paper. Leading AI semiconductor companies have already had success with Tessent DFT tools. To read more, click here. » read more

Blog Review: Feb. 12
By Ed Sperling - 12 Feb, 2020 - Comments: 0

Complexity is growing by process node, by end application, and in each design. The latest crop of blogs points to just how many dependencies and uncertainties exist today, and what the entire supply chain is doing about them. Mentor's Shivani Joshi digs into various types of constraints in PCBs. Cadence's Neelabh Singh examines the complexities of verifying a lane adapter state machine in... » read more

An Optimal Path To DFT Automation
By Jay Jahangiri - 11 Feb, 2020 - Comments: 0

To keep up with time-to-market demands when SoCs keep increasing in size and complexity requires the adoption of better DFT flows and technologies. One of the most successful changes in design-for-test (DFT) flows in recent years has been the deployment of hierarchical DFT. Taking the divide-and-conquer approach delivers real savings in test time and cost, plus keeps DFT out of the critical pat... » read more

Optimal End-to-End DFT Automation With Tessent Connect
By Mentor, a Siemens Business - 11 Feb, 2020 - Comments: 0

With the growth in design size and complexity, DFT engineers began adopting new methods to reduce DFT implementation time, reduce test costs, and reduce risks to design schedules by removing DFT from the critical path to tapeout. The primary method to accomplish large improvements to DFT efficiency is through a divide-and-conquer approach supported by Tessent’s RTL-based, hierarchical DFT ins... » read more

Planning Ahead For In-System Test Of Automotive ICs
By Jeff Mayer - 14 Jan, 2020 - Comments: 0

Automobiles are increasingly more like electronic devices than mechanical platforms. As a share of the total cost of a car, electronics components have grown from about 5% in 1970 to 35% in 2010. Electronics are projected to account for 50% by 2030 (Deloitte, 2019). Some of the electronics are for passive operations, like display or In-Vehicle Infotainment (IVI) systems, but a growing proportio... » read more

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