Embedded Automotive Platforms: Evaluating Power And Performance Of Image Classification And Objects Detection CNNs 


A technical paper titled “Performance/power assessment of CNN packages on embedded automotive platforms” was published by researchers at University of Modena and Reggio Emilia. Abstract: "The rise of power-efficient embedded computers based on highly-parallel accelerators opens a number of opportunities and challenges for researchers and engineers, and paved the way to the era of edge com... » read more

The Road Ahead For SoCs In Self-Driving Vehicles


Automakers have relied on a human driver behind the wheel for more than a century. With Level 3 systems in place, the road ahead leads to full autonomy and Level 5 self-driving. However, it’s going to be a long climb. Much of the technology that got the industry to Level 3 will not scale in all the needed dimensions — performance, memory usage, interconnect, chip area, and power consumption... » read more

What Data Center Chipmakers Can Learn From Automotive


Automotive OEMs are demanding their semiconductor suppliers achieve a nearly unmeasurable target of 10 defective parts per billion (DPPB). Whether this is realistic remains to be seen, but systems companies are looking to emulate that level of quality for their data center SoCs. Building to that quality level is more expensive up front, although ultimately it can save costs versus having to ... » read more

Chiplet Security Risks Underestimated


The semiconductor ecosystem is abuzz with the promise of chiplets, but there is far less attention being paid to security in those chiplets or the heterogeneous systems into which they will be integrated. Disaggregating SoCs into chiplets significantly alters the cybersecurity threat landscape. Unlike a monolithic multi-function chip, which usually is manufactured using the same process tech... » read more

Hunting For Hardware-Related Errors In Data Centers


The semiconductor industry is urgently pursuing design, monitoring, and testing strategies to help identify and eliminate hardware defects that can cause catastrophic errors. Corrupt execution errors, also known as silent data errors, cannot be fully isolated at test — even with system-level testing — because they occur only under specific conditions. To sort out the environmental condit... » read more

Radiation Tolerance Is Not Just For Rocket Scientists


As technology scales, soft errors from particle radiation are becoming increasingly concerning for in-field reliability. These radiation effects are called Single Event Upsets (SEU) and the frequency of the failures due to SEUs is known as the Soft Error Rate (SER). Soft errors are failures due to external sources. By contrast, hard errors refer to actual process manufacturing defects or electr... » read more

How Low Can You Go? Pushing The Limits Of Transistors


Rising demand for cutting-edge mobile, IoT, and wearable devices, along with high compute demands for AI and 5G/6G communications, has driven the need for lower power systems-on-chip (SoCs). This is not only a concern for a device’s power consumption when active (dynamic power), but also when the device is not active (leakage power). This highly competitive industry provides significant rewar... » read more

Debug This! How To Simplify Coverage Analysis And Closure


For years the process of ASIC and FPGA design and verification debug consisted primarily of comprehending the structure and source code of the design with waveforms showing activity over time, based on testbench stimulus. Today, functional verification is exponentially complex with the emergence of new layers of design requirements (beyond basic functionality) that did not exist years ago — f... » read more

Challenges Mount In New Autos


Electronics are becoming the primary differentiator for carmakers, adding an array of options that can alter everything from how a vehicle's occupants interact with their surroundings to how the vehicle drives. But the infrastructure needed to support these features also raises a slew of technology and business questions for which there are no simple answers today. For example, how will new ... » read more

Power Methodology For Estimation And Optimization In The ASIC/SoC Flow


In this white paper, we’ll review the many steps of today’s common ASIC/SoC power methodologies and tool flows. We’ll then propose ways you can further optimize your power methodology to more quickly achieve your PPW goals. Please note, while we acknowledge that energy consumption in digital CMOS logic is a combination of dynamic power and leakage, to keep this white paper to a digestible... » read more

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