Blog Review: July 10

Cadence's Paul Graykowski suggests using real number modeling to streamline digital mixed-signal verification using logic simulators and hardware emulators. Siemens' John McMillan and Microsoft's Amit Kumar introduce the basics of 3D-IC, describe the flow and data management challenges, look at the evolution of TSMC 3DBlox 1.0 and 2.0, and detail a physical verification and reliability analy... » read more

Reducing Design Margins With Silicon Model Calibration

By Guy Cortez and Mark Laird It’s no secret to anyone that chip design gets harder every year. There are two major trends driving these ever-increasing challenges. The first is the continual scaling down to smaller design nodes. Although the pace of new node introduction has slowed somewhat in recent years, the impact of each new geometry and process is more dramatic than ever before. Acce... » read more

Effective Monitoring, Test, and Repair of Multi-Die Designs

Despite clear advantages, there are numerous new challenges that need to be addressed for successful multi-die realization. The multi-die test challenges include: Bare chiplet level (pre-bond) Probe, dedicated/functional pads for test Test, diagnosis, and repair Interconnects (mid/post-bond) Die-to-die test access Lane test, diagnosis, and repair Multi-die ... » read more

Digital Twins Find Their Footing In IC Manufacturing

Momentum is building for digital twins in semiconductor manufacturing, tying together the various processes and steps to improve efficiency and quality, and to enable more flexibility in the fab and assembly house. The movement toward digital twins opens up a slew of opportunities, from building and equipping new fabs faster to speeding yield ramps by reducing the number of silicon-based tes... » read more

Holistic Verification and Validation of Automotive IP for Functional Safety SoCs

Automotive functional safety systems have strict requirements to help avoid damages to life and property in case of a failure. As technology becomes more complex, there are increasing safety-related risks from systematic failures and random hardware failures that must be considered during product development. Standards like ISO 26262 provide guidance to mitigate such safety-related risks, by de... » read more

Security Focus Widens To HW, SW, Ecosystems

Hardware security strategies are pushing much further left in the chip design flow as the number of vulnerabilities in complex designs and connected devices continues to grow, taking into account potential vulnerabilities in both hardware and software, as well as the integrity of an extended global supply chain. These approaches leverage the speed of fixing problems in software, and the effe... » read more

Verification Tools Straining To Keep Up

Verification engineers are the unsung heroes of the semiconductor industry, but they are at a breaking point and desperately in need of modern tools and flows to deal with the rapidly increasing pressures. Verification is no longer just about ensuring that functionality is faithfully represented in an implementation. That alone is an insolvable task, but verification has taken on many new re... » read more

Chip Industry Week In Review

The Design Automation Conference morphed into the Chips to Systems Conference, reflecting an industry shift from monolithic SoCs to assemblies of chiplets in various flavors of advanced packaging. The change drew a slew of students and a resurgent buzz, fueled by discussions about heterogeneous integration, reliability, and ways to leverage AI/ML to speed up design and verification processes. ... » read more

Digital Twins Gaining Traction In Complex Designs

The integration of heterogeneous chiplets into an advanced package, coupled with the increasing digitalization of multiple industry segments, is pushing digital twins to the forefront of design. The challenge in these complex assemblies is figuring out the potential tradeoffs between different chiplets, different assembly approaches, and to be able to do it quickly enough to still hit market... » read more

Enabling 2.5D/3D Multi-Die Package

In the rapidly evolving world of ASIC design, the shift from monolithic to 2.5D and 3D multi-die architectures represents a significant leap forward. This approach, which integrates multiple chiplets (also knowns as dies) into a single package, demands not only a new level of IC design innovation but also an increased complexity in coordination and integration. At the forefront of this technolo... » read more

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