tag: test

The Future Of Connectivity Is Higher Data Rates And Micro-Positioning
By David Vondran - 11 Oct, 2022 - Comments: 0

These days, we tend to take global wireless connectivity for granted. Whether we’re in a coffee shop, a hotel room, or a plane at 35,000 feet, chances are that we’ll be able to enjoy Internet access at reasonable speeds. But despite this constant connectedness, we still manage to misplace our keys and forget where we left our smartphones. New connectivity technologies are promising to ha... » read more

Week In Review: Manufacturing, Test
By Karen Heyman and Anne Meixner - 30 Sep, 2022 - Comments: 0

Highlights from ITC The hot topic at this week’s International Test Conference (ITC) was tackling silent data corruption, with panel discussions, papers, and Google’s Parthasarathy Ranganathan’s keynote address all emphasizing the urgency of the issue. In the past two years Meta, Google, and Microsoft have reported on silent errors, errors not detected at test, which are adversely impact... » read more

Making 5G More Reliable
By Ed Sperling - 08 Sep, 2022 - Comments: 0

The rollout of 5G is a complex and monumental effort involving multiple separate systems that need to function flawlessly together in real-time, making it difficult to determine where problems might arise, or how and when to test for them. Investments in 5G have been underway for the better part of a decade, and the technology is considered the next huge growth opportunity for mobile devices... » read more

Test Data Streaming For The Next Generation Of Designs
By Rahul Singhal - 08 Sep, 2022 - Comments: 0

Semiconductor chips have been evolving to meet the demands of rapidly transforming applications, and so has the test technology to meet the test goals of those chips. Going back two decades or so, the applications were limited and the designs were simpler, thus the concerns about power, performance and area (PPA), turn-around time, re-use and time-to-market, etc., were important but not as crit... » read more

The Future Of Wireless Test Is Over The Air
By David Vondran - 08 Sep, 2022 - Comments: 0

The deployment of mmWave technology is synonymous with 5G rollout and the initial results for faster links are amazing. For example, using a mmWave band, the prospects of a 1-2 Gbps link means a typical HD movie can download in less than a minute. An upload link of 30 Mbps also enables the transfer of videos back to the cloud at a record pace. These user experiences are enabled by the antenna l... » read more

Minimizing Execution Risk In Test Solution Development
By David Ducrocq - 12 Jul, 2022 - Comments: 0

Test development projects are a mix of engineering disciplines with a complex and interdependent ecosystem. The ability to assess risks and their impact on the entire project can be the difference between success and failure. A technical project lead provides a single point of responsibility for assessing technical risk across the project, developing mitigation plans, and driving countermeasure... » read more

Leverage Functional Interfaces For High-Speed Test Access During All Phases Of The Silicon Lifecycle
By Ash Patel - 12 Jul, 2022 - Comments: 0

Chip testing used to be straightforward. The development team used fault simulation to select a subset of the functional tests that could detect most possible manufacturing faults. These were translated to test patterns that ran on automated test equipment (ATE) to screen out defective dies at wafer test and bad packaged chips in final test. Lots of new technology was introduced over time, incl... » read more

IC Reliability Burden Shifts Left
By Ann Mutschler - 23 Jun, 2022 - Comments: 0

Chip reliability is coming under much tighter scrutiny as IC-driven systems take on increasingly critical and complex roles. So whether it's a stray alpha particle that flips a memory bit, or some long-dormant software bugs or latent hardware defects that suddenly cause problems, it's now up to the chip industry to prevent these problems in the first place, and solve them when they do arise. ... » read more

Revising 5G RF Calibration Procedures For RF IC Production Testing
By Amkor - 16 Jun, 2022 - Comments: 0

Modern radio frequency (RF) components introduce many challenges to outsourced semiconductor assembly and test (OSAT) suppliers whose objective is to ensure products are assembled and tested to meet the product test specifications. The growing advancement and demand for RF products for cellphones, navigational instruments, global positioning systems, Wi-Fi, receiver/transmitter (Rx/Tx) componen... » read more

Trends In Testing: New Challenges Create New Opportunities
By Doug Lefever - 07 Jun, 2022 - Comments: 0

As advancements in semiconductors and microelectronics soldier ahead into emerging, even uncharted, territory, new test challenges arise. To that end, let’s look at a few key trends and challenges that are driving opportunities for innovation in the test sector. Technology convergence has been a buzzword for some time, and this trend is only going to intensify with the heightened need to m... » read more

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