tag: test

Optimal End-to-End DFT Automation With Tessent Connect
By Mentor, a Siemens Business - 11 Feb, 2020 - Comments: 0

With the growth in design size and complexity, DFT engineers began adopting new methods to reduce DFT implementation time, reduce test costs, and reduce risks to design schedules by removing DFT from the critical path to tapeout. The primary method to accomplish large improvements to DFT efficiency is through a divide-and-conquer approach supported by Tessent’s RTL-based, hierarchical DFT ins... » read more

Ensuring Functional Safety In Design
By Ed Sperling - 05 Feb, 2020 - Comments: 0

Mohammed Abdelwahid (Ali), automotive logic test product manager at Mentor, a Siemens Business, discusses how to maximize coverage in the different ASIL standards for logic BiST, how to make testing more efficient, and what impact that has on area and test time. » read more

Design For Airborne Electronics
By Ann Mutschler - 03 Feb, 2020 - Comments: 0

The Next Generation Air Transportation System (NextGen), an FAA-led modernization of America's air transportation system meant to make flying more efficient, predictable and safer, is currently underway as one of the most ambitious infrastructure projects in U.S. history. This is not just a minor upgrade to an aging infrastructure. The FAA and partners are in the process of implementing new ... » read more

Week In Review: IoT, Security, Autos
By Susan Rambo - 24 Jan, 2020 - Comments: 0

AI/Edge Vastai Technologies is using Arteris IP’s FlexNoC Interconnect IP and AI Package for its Artificial Intelligence Chips for artificial intelligence and computer vision systems-on-chip (SoCs). Startup Vastai Technologies was founded in December 2018, designs ASICs and software platforms for computer vision and AI applications, such as smart city, smart surveillance, smart education, ac... » read more

Analog: Avoid Or Embrace?
By Brian Bailey - 16 Jan, 2020 - Comments: 0

We live in an analog world, but digital processing has proven quicker, cheaper and easier. Moving digital data around is only possible while the physics of wires can be safely abstracted away enough to provide reliable communications. As soon as a signal passes off-chip, the analog domain reasserts control for modern systems. Each of those transitions requires a data converter. The usage ... » read more

Improving In-System Test With Tessent VersaPoint Test Point Technology
By Mentor, a Siemens Business - 14 Jan, 2020 - Comments: 0

This paper describes a new versatile test point technology called VersaPoint, which has been developed specifically to work with designs implementing mixed EDT/LBIST methodologies to reduce EDT pattern counts and improve Logic BIST (LBIST) test coverage. VersaPoint test points can reduce compressed pattern counts 2X to 4X beyond compression alone and improve LBIST test coverage beyond what is p... » read more

Making 3D Structures And Packages More Reliable
By Ed Sperling - 14 Jan, 2020 - Comments: 0

The move to smaller vertical structures and complex packaging schemes is straining existing testing approaches, particularly in heterogeneous combinations on a single chip and in multi-die packages. The complexity of these devices has exploded with the slowdown in scaling, as chipmakers turn to architectural solutions and new transistor structures rather than just relying on shrinking featur... » read more

Planning Ahead For In-System Test Of Automotive ICs
By Jeff Mayer - 14 Jan, 2020 - Comments: 0

Automobiles are increasingly more like electronic devices than mechanical platforms. As a share of the total cost of a car, electronics components have grown from about 5% in 1970 to 35% in 2010. Electronics are projected to account for 50% by 2030 (Deloitte, 2019). Some of the electronics are for passive operations, like display or In-Vehicle Infotainment (IVI) systems, but a growing proportio... » read more

The Impact Of Test Engineers
By Marie Ryan - 14 Jan, 2020 - Comments: 0

As testing is at the end of each project, it’s often seen as a non-value-added necessity that just needs to be done. This is why Test Engineers often feel overlooked and undervalued. Previously, we explained why engineering managers should value their test engineers, and told them how to get the most out of their teams. Today we’ll explore how test engineers can learn to understand the... » read more

AI Chips Driving Need For New Test Implementation Methodologies
By David Buck - 19 Dec, 2019 - Comments: 0

Artificial intelligence has never been more in the news than it is today.  From picking stock market investments to autonomous driving, we have heard about what AI can do when it works and what happens when it goes awry. The consequences are huge if AI doesn’t work which puts a lot of pressure on hardware engineers to ensure that their chips can be extensively tested for proper and safe func... » read more

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