tag: test

Devices Threatened By Analog Content?
By Brian Bailey - 09 Feb, 2017 - Comments: 0

As the amount of analog content in connected devices explodes, ensuring that the analog portion works properly has taken on a new level of urgency. Analog circuitry is required for interpreting the physical world and for moving data to other parts of the system, while digital circuitry is the fastest way to process it. So a sensor that gives a faulty reading in a car moving at high speed or ... » read more

Addressing Test Time Challenges
By Rohit Dixit - 08 Feb, 2017 - Comments: 0

Unit test time on automated test equipment (ATE) is one of the major components that affects the total cost of manufacturing for semiconductor suppliers. The test programs for each unit can be comprised of thousands of parametric and functional tests that are performed to screen out defective units or dies. However, tester time is expensive, so suppliers are always looking for ways to reduce th... » read more

ATO 2017: Driven by Necessity
By James Truchard - 06 Feb, 2017 - Comments: 0

In the aerospace and defense industry, reducing release cycles and preventing program delays have become increasingly difficult. In automotive, consumer demands are driving up test complexity and introducing new costs in areas like infotainment. In response, test managers must find affordable ways to incorporate RF testing for wireless signals and machine vision testing for assisted parking to ... » read more

Logic Analyzers Never Die
By Jeff Dorsch - 06 Feb, 2017 - Comments: 0

Logic analyzers, long a mainstay of chip design, are finding new demand for IoT devices—and frequently in different forms than in the past. Once associated with big, bulky benchtop instruments, this technology has evolved significantly over the past 40 years. In some cases it has been moved into software, where the measurement results are more likely to be viewed upon a laptop screen or a ... » read more

Standardizing Platforms From Characterization To Production
By NI - 18 Jan, 2017 - Comments: 0

In 1983, the first commercial mobile phone retailed for $3995, almost $10,000 in today’s economy. It supported a single band, weighed almost a kilogram, and was about the size of a brick. Two decades later, a quad-band “world phone” costs a few hundred dollars. Even a basic mobile phone that supports over 20 cellular bands, in addition to Bluetooth, Wireless LAN, and GPS technology, ... » read more

Transistor-Level Defect Diagnosis
By Geir Eide - 22 Dec, 2016 - Comments: 0

Each new semiconductor process node represents exciting opportunities for suppliers of design, manufacturing, test, and failure analysis solutions. A new process means new challenges to solve, and hopefully more money to be made. On the flip side, whenever solutions that address these new challenges are presented, we seldom hear how useful these are to more mature process nodes. One technology ... » read more

Expose Transistor-Level Yield Limiters With Cell-Aware Diagnosis
By Mentor, a Siemens Business - 21 Dec, 2016 - Comments: 0

Cell-aware diagnosis is a new and effective method to perform transistor-level diagnosis to identify defects inside standard cells. It leverages fault models derived from analog simulation and uses a fail data collection and diagnosis flow identical to that of traditional diagnosis. Cell-aware diagnosis in Tessent Diagnosis is the result of over 10 years of research in cell-aware test and was d... » read more

When Exposed To IoT, Big Iron ATE Will Rust
By NI - 14 Dec, 2016 - Comments: 0

When the first “smart” refrigerators were released in the early 2000s, consumers weren’t sure what to do with them. When Nest released the smart thermostat, though, a revolution happened. Humans were taken out of the loop because the thermostat learned on its own about desired temperature and how quickly it could cool or heat a house. And it could synchronize all of this better than a hum... » read more

Formal’s Roadmap
By Brian Bailey - 30 Nov, 2016 - Comments: 0

Formal verification has come a long way in the past five years as it focused on narrow tasks within the verification flow. Semiconductor Engineering sat down to discuss that progress, and the future of formal technologies, with [getperson id="11306" comment="Raik Brinkmann"], president and CEO of [getentity id="22395" e_name="OneSpin Solutions"]; Harry Foster, chief verification scientist at [g... » read more

Testing the Big Bang of Smart Devices
By NI - 19 Oct, 2016 - Comments: 0

Thanks to the proliferation of smart devices in the Internet of Things (IoT), it’s a circumstance not unlike the overwhelming sense of wonder and bewilderment that ancient Greek astronomer Ptolemy must have felt when gazing up at a sky full of stars on a clear winter’s night, trying to rationalize the vast tableau before him. But just as we wouldn’t critique early astronomers and philo... » read more

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