Making 3D Structures And Packages More Reliable


The move to smaller vertical structures and complex packaging schemes is straining existing testing approaches, particularly in heterogeneous combinations on a single chip and in multi-die packages. The complexity of these devices has exploded with the slowdown in scaling, as chipmakers turn to architectural solutions and new transistor structures rather than just relying on shrinking featur... » read more

3 Safety Standards For Auto Electronics


Kurt Shuler, vice president of marketing at Arteris IP, drills down into the three main safety standards, ISO 26262, SOTIF (Safety of the Unintended Function) and UL 4600, what each one covers, what the intent is behind them, and what this means for companies developing technology for future vehicles. » read more

Timing Is Of The Essence


Today's advanced 16/7nm system-on-chips (SoCs) are faced with increased variation as they push for lower power. While the sizes of the transistors continue to shrink following Moore's Law, the threshold voltages fail to scale. This causes wide timing variability leading to timing closure difficulties, design re-spins and poor functional yield. Learn how ANSYS Path FX with its unique variatio... » read more

Taming NBTI To Improve Device Reliability


Negative-bias temperature instability is a growing issue at the most advanced process nodes, but it also has proven extremely difficult to tame using conventional approaches. That finally may be starting to change. NBTI is an aging mechanism in field-effect transistors that leads to a change of the characteristic curves of a transistor during operation. The result can be a drift toward unint... » read more

Mission Profiles


In the field of electronic systems, the mission profile has been one of the key concepts since the start of the scientific examination of the subject of reliability. Its exact meaning varies with time and the industry using it. In particular, over the course of increasing digitalization and networking in the context of IoT and the opportunities resulting from this, the subject of mission profil... » read more

Minimizing Chip Aging Effects


Aging kills semiconductors, and it is a growing problem for an increasing number of semiconductor applications—especially as they migrate to more advanced nodes. Additional analysis and prevention methods are becoming necessary for safety critical applications. While some aspects of aging can be mitigated up front, others are tied to the operation of the device. What can an engineering tea... » read more

Cracking The Auto IC Market


The market for automotive electronics is booming, and it has set off a global scramble among established chipmakers and startups. What's becoming clear, though, is that not everyone understands just how different automotive is from the mobile market. Mobile is still the highest-volume market for semiconductors, but the growth has flattened. In contrast, the value of the automotive electronic... » read more

Chip Aging Becomes Design Problem


Chip aging is a growing problem at advanced nodes, but so far most design teams have not had to deal with it. That will change significantly as new reliability requirements roll out across markets such as automotive, which require a complete analysis of factors that affect aging. Understanding the underlying physics is critical, because it can lead to unexpected results and vulnerabilities. ... » read more

Aging Effects


Tech Talk: Fraunhofer EAS' group manager for quality and reliability, Andre Lange, talks about how to model aging effects and why the problems are becoming more difficult at advanced nodes. https://youtu.be/XHWww2PE7aY » read more

7nm Design Challenges


Ty Garibay, CTO at ArterisIP, talks about the challenges of moving to 7nm, who’s likely to head there, how long it will take to develop chips at that node, and why it will be so expensive. This also raises questions about whether chips will begin to disaggregate at 7nm and 5nm. https://youtu.be/ZqCAbH678GE » read more

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