tag: automotive

Multiphysics Reliability Signoff For Next-Generation Automotive Electronics Systems
By Ansys - 08 Jul, 2020 - Comments: 0

Automotive electronics systems depend on an ever-increasing number of electronic sensors and processing elements, which allow for 360-degree surveillance and object identification/classification. Designing and verifying these systems is, however, as complex as the systems themselves. This white paper examines how automotive chip designers can achieve the stringent safety and reliability requ... » read more

Next Challenge: Known Good Systems
By Ed Sperling - 07 Jul, 2020 - Comments: 0

The leading edge of design is heading toward multi-die/multi-chiplet architectures, and an increasing number of mainstream designs likely will follow as processing moves closer to the edge. This doesn't mean every chipmaker will be designing leading-edge chips, of course. But more devices will have at least some leading-edge logic or will be connected over some advanced interconnect scheme t... » read more

Data Becomes Key For Next-Gen Chips
By Susan Rambo And Ed Sperling - 07 Jul, 2020 - Comments: 1

Data has become vital to understanding the useful life of a semiconductor — and the knowledge gleaned is key to staying competitive beyond Moore’s Law. What's changed is a growing reliance earlier in the design cycle on multiple sources of data, including some from further right in the design-through-manufacturing flow. While this holistic approach may seem logical enough, the semiconduc... » read more

Chip Reliability Vs. Cost
By Ed Sperling - 05 Jul, 2020 - Comments: 0

Semiconductor Engineering sat down to discuss the cost, reliability and security with Simon Segars, CEO of Arm; Joseph Sawicki, executive vice president of IC EDA at Mentor, a Siemens Business; Raik Brinkmann, CEO of OneSpin Solutions; Babak Taheri, CEO of Silvaco; John Kibarian, CEO of PDF Solutions; and Prakash Narain, CEO of Real Intent. What follows are excerpts of that virtual conversation... » read more

Mitigating The Effects Of Radiation On Advanced Automotive ICs
By Jacob Wiltgen - 01 Jul, 2020 - Comments: 0

The safety considerations in an automotive IC application have similarities to what is seen in other safety critical industries, such as the avionics, space, and industrial sectors. ISO 26262 is the state-of-the-art safety standard guiding the safety activities and work products required for electronics deployed in an automotive system. ISO 26262 requires that a design be protected from the eff... » read more

Automotive Gateway IP Enabling Scalable Automotive Platforms
By Ron DiGiuseppe - 01 Jul, 2020 - Comments: 1

As automakers introduce new electronic platforms, the system architectures are changing from distributed ECUs to integrated domain compute modules. This evolution, along with the increased number and types of sensors for ADAS systems, is having a big impact on the automotive Ethernet network and gateway function. Automotive Ethernet and gateways do more than support mobile connectivity, they en... » read more

An Automotive Value Chain In Flux
By Kurt Shuler - 01 Jul, 2020 - Comments: 0

When companies view suppliers from inside their specialized niches, it is tempting to imagine the business world will continue as-is, with just minimal improvements each year. But in the automotive value chain, this no longer holds. The rapid pace of innovation around intelligent systems in cars is disrupting the business flow. Back in simpler times, semiconductor companies would work with Tier... » read more

Understand MOSFET Switch Behavior Via An LED Driver Simulation
By John Christopher Rice - 01 Jul, 2020 - Comments: 0

Automotive incandescent bulbs have largely given way to more efficient, reliable, stylish, and even safer light emitting diodes (LEDs). LEDs turn on in a fraction of the time and are especially useful in brake lamps, where fractions of a second matter. The challenge in designing an automotive LED lamp is in satisfying government requirements for light output while also being cost effective. Ano... » read more

Variables Complicate Safety-Critical Device Verification
By Ann Mutschler - 01 Jul, 2020 - Comments: 0

The inclusion of AI chips in automotive and increasingly in avionics has put a spotlight on advanced-node designs that can meet all of the ASIL-D requirements for temperature and stress. How should designers approach this task, particularly when these devices need to last longer than the applications? Semiconductor Engineering sat down to discuss these issues with Kurt Shuler, vice president of... » read more

Using Built-In Self-Test Hardware To Satisfy ISO 26262 Safety Requirements
By Mentor, a Siemens Business - 30 Jun, 2020 - Comments: 0

The promise of autonomous vehicles is driving profound changes in the design and testing of automotive semiconductor parts. The ICs for safety-critical applications need to meet the ISO 26262 standard for functional safety. Among the challenges in the design flow has been aligning the metrics for design-for-test and for functional safety. This paper describes using logic built-in-self-test as b... » read more

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