tag: ball grid array

How To Identify Common Electronic Failures
By Tyler Ferris - 14 Oct, 2021 - Comments: 0

Failure analysis is the process of identifying, and typically attempting to mitigate, the root cause of a failure. In the electronics industry, failure analysis involves isolating the failure to a location on a printed circuit board assembly (PCBA) before collecting more detailed data to investigate which component or board location is functioning improperly. A member of the Ansys Reliabil... » read more

Chip Board Interaction Analysis Of 22nm FD-SOI Technology In WLP
By Amkor - 17 Mar, 2021 - Comments: 0

Recently, Wafer Level Packaging (WLP) has been in high demand, especially in mobile device applications as a path to enable miniaturization while maintaining good electrical performance. The relatively inexpensive package cost and simplified supply chain are encouraging other industries to adapt WLP capabilities for radio frequency (RF), communications/sensing (mmWave) and automotive applicatio... » read more

A Production-Worthy Fan-Out Solution — ASE FOCoS Chip Last
By ASE - 16 Dec, 2020 - Comments: 0

The 5th Generation (5G) wireless systems popularity will push the package development into a high performance and heterogeneous integration form. For high I/O density and high performance packages, the promising Fan Out Chip on Substrate (FOCoS) provides a solution to match outsourced semiconductor assembly and testing (OSAT) capability. FOCoS is identified the Fan Out (FO) package, which can f... » read more

Using Digital Image Correlation To Determine BGA Warpage
By Craig Hillman - 16 Jan, 2020 - Comments: 0

Digital image correlation (DIC) is a non-contact, full-field displacement, optical measurement technique. It is often used in the following applications: Material characterization Coefficient of thermal expansion (CTE) Glass transition temperature Young’s modulus Poisson’s ratio Sample testing for fatigue and failure In situ monitoring of displacements and str... » read more

Reliability Of Embedded Wafer-Level BGA For Automotive Radar Applications
By STATS ChipPAC - 11 Dec, 2017 - Comments: 0

With shrinking of chip sizes, Wafer Level Chip Scale Packaging (WLCSP) becomes an attractive and holistic packaging solutions with various advantages in comparison to conventional packages, such as Ball Grid Array (BGA) with flipchip or wirebonding. With the advancement of various fan-out (FO) WLPs, it has been proven to be a more optimal, low cost, integrated and reliable solution compared to ... » read more

Wirebond Technology Rolls On
By Mark LaPedus - 08 May, 2017 - Comments: 2

Several years ago, many predicted the demise of an older interconnect packaging technology called wire bonding, prompting the need for more advanced packaging types. Those predictions were wrong. The semiconductor industry today uses several advanced packaging types, but wire bonding has been reinvented over the years and remains the workhorse in packaging. For example, Advanced Semiconducto... » read more

Inside Advanced Packaging
By Mark LaPedus - 18 Feb, 2016 - Comments: 0

Semiconductor Engineering sat down to discuss advanced IC-packaging, the OSAT industry, China and other topics with Ron Huemoeller, vice president of worldwide R&D at Amkor. What follows are excerpts of that conversation. SE: Where are we in advanced IC-packaging today? Huemoeller: We’ve hit the inflection point. Now we are coming to the other side of it. Regarding this need to int... » read more

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