Smarter Ways To Manufacture Chips


OSAT and wafer fabs are beginning to invest in Industry 4.0 solutions in order to improve efficiency and reduce operating costs, but it's a complicated process that involves setting up frameworks to evaluate different options and goals. Semiconductor manufacturing facilities have relied on dedicated automation teams for decades. These teams track and schedule chip production, respond to equi... » read more

Getting Smarter About Tool Maintenance


Chipmakers have begun to shift to predictive maintenance for process tools, but the hefty investment in analytics and engineering efforts means it will take some time for smart maintenance to become a widespread practice. Semiconductor manufacturers need to maintain a diverse set of equipment to process the flow of wafers, dies, packaged parts, and boards running through factories. OSAT and ... » read more

AI-Driven Big Data Analytics Enables Actionable Intelligence, Improving SoC Design Productivity


As the latest systems on chip (SoCs) grow in size and complexity, a vast amount of design data is generated during verification and implementation. Design data is business critical and, with the proliferation of artificial intelligence (AI) use in chip design, provides designers an opportunity to carry forward learnings and insights with every new design. To achieve first-pass success deliverin... » read more

In-field In-Mission Reliability Monitoring Based On Deep Data


This paper describes a Deep Data approach to reliability monitoring in advanced electronics, based on degradation as a precursor for failure. By applying machine learning algorithms and analytics to data created by on-chip monitoring IPs (Agents), IC/system health and performance can be continuously monitored, at all stages of the product lifecycle. Realtime degradation analysis of critical par... » read more

Week in Review: IoT, Security, Autos


Products/Services Arm released a survey of 650 industry representatives about eSIM and iSIM technology. Ninety percent of the respondents were aware of eSIM, while 43% were unaware of iSIM. Vincent Korstanje, vice president and general manager, Emerging Businesses at Arm, cites the leading three obstacles to large commercial deployments: Resistance from traditional stakeholders (69% of respond... » read more

The Week in Review: IoT


Finance BroadLink has raised $54.4 million in Series D funding from Citic Private Equity Funds Management. Baidu and Libai Group participated in the new round. BroadLink will use the money to expand its artificial intelligence and Internet of Things units, while also acquiring or investing in companies involved in smart home devices. Aperio Systems of Haifa, Israel, has received $4.5 millio... » read more

The Week in Review: IoT


Finance VDOO Connected Trust received $13 million in seed funding led by 83North, with participation by Dell Technology Capital and individual investors David Strohm, Joe Tucci, and Victor Tsao. The startup offers Internet of Things device developers the capability to add cybersecurity features to those devices after they’re deployed. VDOO was founded last year in Israel by Netanel Davidi, U... » read more

The Week In Review: IoT


Finance August Home received $25 million in Series C funding, bringing its total funding to $75 million. Existing investors Bessemer Venture Partners, Comcast Ventures, Maveron, and Qualcomm Ventures were joined by AGL, Liberty Mutual, and SPDG. The Internet of Things startup will use the money to expand operations and to extend its offerings in home access products and services. Prospera, ... » read more

Are All Known Good Tested Devices Created Equal?


Your known good parts all had passed their required wafer sort, final test, and system-level tests and were shipped to your customers. However, as we all know, a known good part or device sometimes does not stay good and may end up failing prematurely in the field and flagged as an RMA (return material authorization) by your customer. But why is it that some good parts fail early and others las... » read more