SoC Architects Face Big Challenges


By Ann Steffora Mutschler While the geometries of advanced node processes such as 28nm and below may not greatly impact SoC architectures, the complexity enabled by the leading edge brings intense challenges all the same. With the ability to put more transistors onto a chip come new possibilities such as the increasing use of multi-core architectures and lots of integrated hardware en... » read more

Mixing It Up


By Ann Steffora Mutschler To enable the next level of productivity in the verification space, certain tools need to be combined and integrated in a very meaningful way. The concept is far from new. This happened on the RTL to GDS front between synthesis and place and route. The tools work very closely and there is bi-directional collaboration. It also happened in the functional verification... » read more

Cost Per Transistor Gets Fuzzier


By Ed Sperling Cost per transistor always has been a major reason for chipmakers to migrate to the next process node. By shrinking transistors and adding more logic, performance usually gets a boost. Moreover, that usually provides enough engineering wiggle room to add some improvements in energy efficiency. The basic assumption that you can double the number of transistors every 24 months,... » read more

Changes In The Supply Chain


Runaway complexity in design, implementation, verification and manufacturing is being mirrored across an increasingly complex supply chain. Now the question is what to do about it. Complexity is being driven by the continued shrinking of feature sizes and the clamor for more functionality to leverage the real estate that becomes available with each new process node. But the increased density... » read more

Mixed-Signal Technology Summit Proceedings


On September 20 Cadence held the second Mixed-Signal Technology Summit. Experts from Cadence and other leading companies presented the latest mixed-signal design methodologies. If you missed the event, you can still view the material via the below archived proceedings. To view the presentations and videos, click here. » read more

It’s The Data, Stupid!


By Frank Schirrmeister January is prediction month! After writing my 10 year Look-Back on Technology last week, I attended an IDC briefing called “Riding the Momentum: IDC Software Predictions 2013.” IDC is looking at the IT world from four angles that they call four pillars: Cloud, Big Data/Analytics, Social Business and Mobility. In the opening presentation—called “In a Diverse Wo... » read more

ESL Challenges


System-Level Design talks about the challenges of ESL with Cadence's Ran Avinun, Synopsys' Johannes Stahl, Mentor Graphics' Thomas Bollaert and Forte Design Systems' Brett Cline.   [youtube vid=HftMM71Epqo] » read more

Reducing The Drama In DFM


By Ann Steffora Mutschler For reducing cycle time of DFM checks prior to manufacturing, pattern matching is a topic of great excitement as of the past few manufacturing nodes. The idea behind the technology is that there are certain patterns in the physical layout of the chip, which unless they are addressed, won’t come out right. That’s what causes the drama, observed Saleem Haider, se... » read more

Stacked Die From A Networking Angle


By Mark LaPedus The first wave of 2.5D chips using silicon interposers are trickling out in the marketplace.FPGA vendor Xilinx was the first chipmaker to ship a 2.5D device, and Altera, Cisco, Huawei and IBM recently have talked about their respective 2.5D chip developments. Generally, Altera and Xilinx have taken a somewhat identical and straightforward approach. The two companies are sepa... » read more

It’s Transition Time Again


By Ed Sperling After decades of shrinking features, developing new software on every level and engineering huge improvements in energy efficiency and performance, the semiconductor industry has reached a crossroads. To get to the next level will require massive improvements on all fronts, but not all consumers will be willing to pay for them. For example, if a battery lasts an entire day f... » read more

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