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Measuring Frequency Dependence Across 5G mmWave Bands (NIST)


New research paper from NIST, "Methodology for Measuring the Frequency Dependence of Multipath Channels Across the Millimeter-Wave Spectrum." Abstract "Millimeter-wave (mmWave) communications promise Gigabit/s data rates thanks to the availability of large swaths of bandwidth between 10–100 GHz. Although cellular operators prefer the lower portions of the spectrum due to popular belief ... » read more

Manufacturing Bits: Sept. 8


Calibrating a microphone The National Institute of Standards and Technology (NIST) has developed a faster and more accurate way to calibrate a microphone. NIST’s new calibration technique makes use of lasers, a promising technology that could supplant today’s methods. The technology could one day be used to calibrate sensitive microphones in factories, power plants and other settings li... » read more

Sensor Fusion Everywhere


How do you distinguish between background noise and the sound of an intruder breaking glass? David Jones, head of marketing and business development for intuitive sensing solutions at Infineon, looks at what types of sensors are being developed, what happens when different sensors are combined, what those sensors are being used for today, and what they will be used for in the future. » read more

Process Model Calibration: The Key To Building Predictive And Accurate 3D Process Models


The semiconductor industry has always faced challenges caused by device scaling, architecture evolution, and process complexity and integration. These challenges are coupled with a need to provide new technology to the market quickly. In the initial stages of semiconductor technology development, innovative process flow schemes must be tested using silicon test wafers. These wafer tests are len... » read more

Process Model Calibration: Building Predictive And Accurate 3D Process Models


The semiconductor industry has always faced challenges caused by device scaling, architecture evolution and process complexity and integration. These challenges are coupled with a need to provide new technology to the market quickly. In the initial stages of semiconductor technology development, innovative process flow schemes must be tested using silicon test wafers. These wafer tests are leng... » read more

Manufacturing Bits: Jan. 27


Calibration systems go portable The National Institute of Standards and Technology (NIST) is selling a new portable, vacuum-based calibration unit for use in instruments and other systems. The system, dubbed the Portable Vacuum Standard (PVS), is a compact unit that enables precise calibrations and measurements at a customer’s facility. Housed in the white “igloo” enclosure, the syste... » read more