tag: data analytics

What’s WAT? An Overview Of WAT/PCM Data
By yieldHUB - 12 Oct, 2020 - Comments: 0

Wafer acceptance testing (WAT) also known as process control monitoring (PCM) data is data generated by the fab at the end of manufacturing and generally made available to the fabless customer for every wafer. The data will typically have between forty and one hundred tests, each test having a result for each site (or “drop-in”) on the wafer. The sites are located so that the fab can monito... » read more

Israel: Startup Powerhouse
By Ed Sperling - 05 Oct, 2020 - Comments: 0

Israel is at the front of pack with China and the United States when it comes to tech startups. But when it comes to large, indigenous tech giants, the country is nowhere to be seen. Virtually every major semiconductor company does business in Israel, and many have a strong presence there through centers of excellence or companies they have acquired. But after decades of innovation ranging f... » read more

Early And Fine Virtual Binning
By Noam Brousard - 08 Sep, 2020 - Comments: 0

Not all chips are created equal, and this is viewed as both a blessing and a curse by semiconductor makers. On one hand, chips can be screened for certain attributes, and some of the chips can be sold for higher prices than others. On the other hand, variations in the production process cause silicon performance to greatly differ, leaving chip makers with a wide and somewhat unpredictable distr... » read more

Challenges In Using AI In Verification
By Ann Mutschler - 27 Aug, 2020 - Comments: 0

Pressure to use AI/ML techniques in design and verification is growing as the amount of data generated from complex chips continues to explode, but how to begin building those capabilities into tools, flows and methodologies isn't always obvious. For starters, there is debate about whether the data needs to be better understood before those techniques are used, or whether it's best to figure... » read more

Semiconductors And The Climate Curve
By Rob Aitken - 13 Aug, 2020 - Comments: 0

On July 22 I participated in a panel at the virtual SEMICON West conference called “Bending the Climate Curve: Enabling Sustainable Growth of Big Data, AI, and Cloud Computing.” Virtual conferences are mandatory these days, but give a different experience than physical ones. They are very good at disseminating information and are reasonably effective at networking. But, in my experience... » read more

RMAs: Root Problem Found
By Yuval Bonen - 29 Jun, 2020 - Comments: 0

For decades, costs of production and maintenance have been driven down through manufacturing, process and logistical innovation, creating more breathing room for margin to maintain viable growth. There are other costs, however, that we seemingly accept as inevitable and simply get better at factoring in as par-for-the-course, or ‘eggs broken’ to make the omelet. The ubiquitous presence of ... » read more

Week In Review: Design, Low Power
By Jesse Allen - 12 Jun, 2020 - Comments: 0

Synopsys acquired Qualtera, a provider of big data analytics for semiconductor test and manufacturing. Based in Montpellier, France and founded in 2010, Qualtera's Silicondash platform provides both off-line and in-line modules for data analytics, visualization, simulation, and modeling to allow for development of control strategies. Combined with Synopsys' TestMAX test automation solution, the... » read more

Cleaning Data For Final Test
By Ed Sperling - 20 May, 2020 - Comments: 0

John O’Donnell, CEO of yieldHUB, talks about why data integrity is so critical for final test, what can cause it to be less-than-perfect, what’s needed to improve the quality of that data, and how that impacts the overall yield in a fab. » read more

New Uses For Manufacturing Data
By Ed Sperling - 12 May, 2020 - Comments: 0

The semiconductor industry is becoming more reliant on data analytics to ensure that a chip will work as expected over its projected lifetime, but that data is frequently inconsistent or incomplete, and some of the most useful data is being hoarded by companies for competitive reasons. The volume of data is rising at each new process node, where there are simply more things to keep track of,... » read more

Covid-19 Tech Bits: April 14
By Linda Christensen - 14 Apr, 2020 - Comments: 0

Modeling coronavirus spread Four teams of Finnish researchers have modeled the coughing spread of COVID-19 in tight indoor areas, such as grocery stores and public transportation systems, using a supercomputer and 3D visualization. “The aerosol cloud spreads outside the immediate vicinity of the coughing person and dilutes in the process," said Aalto University Assistant Professor Ville V... » read more

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