What’s Required To Secure Chips

By Ed Sperling - 06 Apr, 2023 - Comments: 0

Experts at the Table: Semiconductor Engineering sat down to talk about how to verify that a semiconductor design will be secure, with Mike Borza, Synopsys scientist; John Hallman, product manager for trust and security at Siemens EDA; Pete Hardee, group director for product management at Cadence; Paul Karazuba, vice president of marketing at Expedera; and Dave Kelf, CEO of Breker Verification. ... » read more

Advanced Digital Process Nodes Drive Semiconductor Test Innovations

By Regan Mills - 07 Mar, 2023 - Comments: 0

Global internet traffic is growing exponentially, with no sign of slowing, and this demand is driving the evolution of the semiconductor industry. The appetite for more and more data requires sensors for capturing the data, networks for moving the data, storage, and processing power to analyze the data. As the demand for data grows, the underlying technologies must advance to not only meet toda... » read more

Achieve Dramatic Productivity And Turnaround Time Improvements In Early Design Electrical Rule Checking

By Siemens EDA - 22 Feb, 2023 - Comments: 0

Early-stage layout vs. schematic (LVS) and circuit verification typically return large numbers of connectivity errors, which can be a critical bottleneck for both LVS and physical verification flows that require correct connectivity for valid results. The Calibre nmLVS Recon tool targets essential and relevant early-stage circuit verification pain points, such as electrical rule checking (ERC) ... » read more

Using Machine Learning To Automate Debug Of Simulation Regression Results

By Synopsys - 08 Feb, 2023 - Comments: 0

Regression failure debug is usually a manual process wherein verification engineers debug hundreds, if not thousands of failing tests. Machine learning (ML) technologies have enabled an automated debug process that not only accelerates debug but also eliminates errors introduced by manual efforts. This white paper discusses how verification engineers can more efficiently analyze, bin, triage... » read more

Achieve 10X Faster CDC Debug Leveraging Machine Learning

By Synopsys - 25 Jan, 2023 - Comments: 0

Over the years, system-on-chip (SoC) design sizes have crossed the billion-gate mark. Higher complexity has been introduced within semiconductor designs to deliver desired functionality. The number of asynchronous clock and reset domains is growing heavily within these complex SoCs, leading to millions of clock domain crossing (CDC) violations at the SoC level. Each of these violations ... » read more

Design And Verification Methodologies Breaking Down

By Brian Bailey - 12 Jan, 2023 - Comments: 0

Tools, methodologies and flows that have been in place since the dawn of semiconductor design are breaking down, but this time there isn't a large pool of researchers coming up with potential solutions. The industry is on its own to formulate those ideas, and that will take a lot of cooperation between EDA companies, fabs, and designers, which has not been their strong point in the past. It ... » read more

Efficient Trace In RISC-V

By Ed Sperling - 19 Dec, 2022 - Comments: 0

Systems with RISC-V cores often include multiple types of other processors and accelerators. Peter Shields, product manager for Tessent at Siemens Digital Industries Software, talks about what's needed for debug and trace in context, including the need for unobtrusive observation at full speed, what to trace and when to trace it, and how embedded IP can identify to report which branches are tak... » read more

Manage Your Risk In RISC-V

By Peter Shields - 06 Dec, 2022 - Comments: 0

Adoption of RISC-V processors is accelerating. This technology, like everything, comes with benefits and risks. The open standard means freedom for many developers, but success depends on the development of a support ecosystem around RISC-V. Industry collaboration is making broad adoption of RISC-V possible, and one example is the introduction of efficient trace for RISC-V cores. When incorp... » read more

Bug-Free Designs

By Brian Bailey - 27 Oct, 2022 - Comments: 0

It is possible in theory to create a design with no bugs, but it's impractical, unnecessary, and extremely difficult to prove for bugs you care about. The problem is intractable because the potential state space is enormous for any practical design. The industry has devised ways to handle this complexity, but each has limitations, makes assumptions, and employs techniques that abstract the p... » read more

Debug This! How To Simplify Coverage Analysis And Closure

By Yara Essam - 10 Oct, 2022 - Comments: 0

For years the process of ASIC and FPGA design and verification debug consisted primarily of comprehending the structure and source code of the design with waveforms showing activity over time, based on testbench stimulus. Today, functional verification is exponentially complex with the emergence of new layers of design requirements (beyond basic functionality) that did not exist years ago — f... » read more

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tag: debug

What’s Required To Secure Chips

Advanced Digital Process Nodes Drive Semiconductor Test Innovations

Achieve Dramatic Productivity And Turnaround Time Improvements In Early Design Electrical Rule Checking

Using Machine Learning To Automate Debug Of Simulation Regression Results

Achieve 10X Faster CDC Debug Leveraging Machine Learning

Design And Verification Methodologies Breaking Down

Efficient Trace In RISC-V

Manage Your Risk In RISC-V

Bug-Free Designs

Debug This! How To Simplify Coverage Analysis And Closure

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