tag: finFETs

Top Articles For 2015 In SLD And LPHP
By Brian Bailey - 24 Nov, 2015 - Comments: 0

Knowing your readership is the first step in being able to serve them better, and judging by the traffic increases this year, we must be doing quite a few things right. We have now completed our second full year and the first full year for the Knowledge Center (KC). We are pleased with the way in which the two are playing together but there is still a lot of work ahead of and many holes to fill... » read more

Measuring FinFETs Will Get Harder
By Mark LaPedus - 19 Nov, 2015 - Comments: 2

The industry is gradually migrating toward chips based on finFET transistors at 16nm/14nm and beyond, but manufacturing those finFETs is proving to be a daunting challenge in the fab. Patterning is the most difficult process for finFETs. But another process, metrology, is fast becoming one of the biggest challenges for the next-generation transistor technology. In fact, [getkc id="252" kc_n... » read more

Placing Bets On Future Technology
By Ed Sperling - 16 Nov, 2015 - Comments: 0

Marie Semeria, CEO of Leti, sat down with Semiconductor Engineering to talk about where the French research and technology organization is placing its future technology bets and what's behind those decisions. What follows are excerpts of that discussion. SE: It's becoming more difficult and expensive to shrink features, so where do we go next? Semeria: We see several areas that we believe... » read more

Micro-Architectural Exploration For Low Power Design
By Abhishek Ranjan - 12 Nov, 2015 - Comments: 0

By Abishek Ranjan, Saurabh Shrimal and Sanjiv Narayan The adoption of finFET technology has created a tectonic shift in the chip design landscape. In addition to better performance (within the same power envelope) and higher reliability, finFETs have significantly reduced the leakage power at smaller technology nodes. At the same time, the share of dynamic power dissipation continues to rise... » read more

Design, Test & Repair Methodology For FinFET-Based Memories
By Synopsys - 11 Nov, 2015 - Comments: 0

Like any IP block, memories need to be tested. But unlike many other IP blocks, memory test is not as simple as pass/fail. The advent of FinFET-based memories presents new memory test challenges. This white paper covers: The new design complexities, defect coverage and yield challenges presented by FinFET-based memories. How to synthesize test algorithms for detection and diagnosis of Fin... » read more

China’s Fab Tool Biz Heats Up
By Mark LaPedus - 28 Oct, 2015 - Comments: 0

For years, China has been a steady growth market for suppliers of semiconductor equipment. Internally, though, the country is comprised of trailing-edge fabs and IC-assembly houses, which means equipment vendors sell relatively mature tools and compete on price. That’s about to change, however. Today, the IC equipment business is heating up in China as the nation begins to upgrade and pour... » read more

Increasing Challenges At Advanced Nodes
By Ed Sperling - 22 Oct, 2015 - Comments: 1

Gary Patton, chief technology officer at GlobalFoundries, sat down with Semiconductor Engineering to talk about new materials, stacked die, how far FD-SOI can be extended, and new directions for interconnects and transistors. What follows are excerpts of that conversation. SE: Where do you see problems at future nodes? Patton: At the device level, we have to be able to pattern these thing... » read more

What China Is Planning
By Mark LaPedus - 21 Oct, 2015 - Comments: 1

Over the years, China has unveiled several initiatives to advance its domestic semiconductor industry. China has made some progress at each turn, although every plan has fallen short of expectations. But now, the nation is embarking on several new and bold initiatives that could alter the IC landscape. China’s new initiatives address at least three key challenges for its IC industry: 1. C... » read more

Accurate Thermal Analysis, Including Thermal Coupling Of On-Chip Hot Interconnect
By Norman Chang - 15 Oct, 2015 - Comments: 0

Driven by rapid advancement in mobile/server computing and automotive/communications, SoCs are experiencing a fast pace of functional integration along with technology scaling. Advanced low power techniques are widely used, while meeting higher performance requirements using a variety of packaging technologies. The Internet of Things (IoT) is further opening up new applications with connected d... » read more

Abstraction: Necessary But Evil
By Brian Bailey - 14 Oct, 2015 - Comments: 1

Abstraction allows aspects of a design to be described in an executable form much earlier in the flow. But some abstractions are breaking down, and an increasing amount of lower-level information has to be brought upstream in order to provide estimates that are close enough to reality so informed decisions can be made. The value of abstractions in design cannot be overstated. High levels of ... » read more

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