tag: Fraunhofer

Manufacturing Bits: March 2
By Mark LaPedus - 02 Mar, 2021 - Comments: 0

Next-gen AFM At the recent SPIE Advanced Lithography conference, Imec, Infinitesima and others described a new metrology tool technology called a Rapid Probe Microscope (RPM). Infinitesima has shipped its first RPM 3D system, enabling three-dimensional (3D) metrology applications for leading-edge chips. The system was jointly developed with Imec. In the IEDM paper, Imec and Infinitesima... » read more

Design Support For A Green IoT
By Dirk Mayer - 11 Feb, 2021 - Comments: 0

By Dirk Mayer and Roland Jancke The Internet of Things (IoT) is growing rapidly all around the world. New devices are continually being added, all collecting a variety of data and transmitting them (often wirelessly) to edge devices, which in turn relay the data to the cloud for further processing. It is estimated that in a few years IoT devices will be responsible for over 20% of global ene... » read more

Manufacturing Bits: Jan. 11
By Mark LaPedus - 11 Jan, 2021 - Comments: 0

3D printing with liquids Martin Luther University Halle-Wittenberg (MLU) has developed a way to combine both materials and liquids in 3D printing applications. Researchers from MLU have developed liquid‐filled capsules using 3D printing technology. This in turn enables new medical agents to be incorporated into pharmaceutical products. It also allows liquids to be integrated into material... » read more

Top Tech Videos Of 2020
By Linda Christensen - 30 Dec, 2020 - Comments: 0

2020 shaped up to be a year of major upheaval, emerging markets and even increased demand in certain sectors. So it's not surprising that videos focusing on AI, balancing power and performance, designing and manufacturing at advanced nodes, advanced packaging, and automotive-related subjects were the most popular. Of the 68 videos published this year, the following were the most viewed in ea... » read more

Re-Architecting SerDes
By Brian Bailey - 10 Dec, 2020 - Comments: 0

Serializer/Deserializer (SerDes) circuits have been helping semiconductors move data around for years, but new process technologies are forcing it to adapt and change in unexpected ways. Traditionally implemented as an analog circuit, SerDes technology has been difficult to scale, while low voltages, variation, and noise are making it more difficult to yield sufficiently. So to remain releva... » read more

Functional Safety For Fail-Operational Systems
By Jens Michael Warmuth - 10 Dec, 2020 - Comments: 0

Functional safety issues have long been an important part of product development wherever machine operations that are potentially dangerous for humans are carried out unattended. However, in terms of electrical and electronic systems, the need has been limited to a few industries such as medical technology and aerospace. Apart from that, the functional safety concepts were only used for niche p... » read more

LDFO SiP For Wearables & IoT With Heterogeneous Integration
By Amkor - 02 Dec, 2020 - Comments: 0

Authors A. Martins*, M. Pinheiro*, A. F. Ferreira*, R. Almeida*, F. Matos*, J. Oliveira*, Eoin O´Toole*, H. M. Santos†, M. C. Monteiro‡, H. Gamboa‡, R. P. Silva* ‡Fraunhofer Portugal AICOS, Porto, Portugal †INESC TEC *AMKOR Technology Portugal, S.A. ABSTRACT The development of Low-Density Fan-Out (LDFO), formerly Wafer Level Fan-Out (WLFO), platforms to encompass the require... » read more

Brute-Force Analysis Not Keeping Up With IC Complexity
By Brian Bailey - 24 Nov, 2020 - Comments: 0

Much of the current design and verification flow was built on brute force analysis, a simple and direct approach. But that approach rarely scales, and as designs become larger and the number of interdependencies increases, ensuring the design always operates within spec is becoming a monumental task. Unless design teams want to keep adding increasing amounts of margin, they have to locate th... » read more

Electronics For Quantum Communications
By Andy Heinig - 12 Nov, 2020 - Comments: 1

Our secure digital communications so far have functioned on the principle of key-based encryption. This involves generating a key of appropriate length, which is then used to encrypt the data. Because distributing the keys is difficult, the keys are reused rather than regularly generating new ones. The regular use of the keys opens up the encryption process to attacks by mathematical methods... » read more

Dealing With Sub-Threshold Variation
By Bryon Moyer - 12 Nov, 2020 - Comments: 0

Chipmakers are pushing into sub-threshold operation in an effort to prolong battery life and reduce energy costs, adding a whole new set of challenges for design teams. While process and environmental variation long have been concerns for advanced silicon process nodes, most designs operate in the standard “super-threshold” regime. Sub-threshold designs, in contrast, have unique variatio... » read more

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