Standard Evolution


I recently had the opportunity to sit down with Lu Dai, chairman of Accellera Systems Initiative and senior director of engineering for Qualcomm. SE: I have noticed a change in the way that Accellera operates these days. In the past, standards were driven by the EDA companies, but recently we have seen a lot more end-user company involvement and they are the companies driving new standards. ... » read more

Speeding Up Verification Using SystemC


Brett Cline, senior vice president at OneSpin Solutions, explains how adding formal verification into the high-level synthesis flow can reduce the time spent in optimization and debug by about two-thirds, why this needs to be done well ahead of RTL, starting with issues such as initialization, memory out of bounds and other issues that are difficult to find in simulation. » read more

Improving Functional Safety For ICs


The exponential growth of electronics in automobiles have stimulated significant innovation towards the development of advanced safety mechanisms. In addition to very high-quality manufacturing test, ICs for safety-critical applications need in-system test to detect faults and monitor circuit aging. Scan-based logic built-in-self-test (LBIST) is the technique used for in-system test, but tradit... » read more

Automating Failure Mode Analysis For Automotive Safety


By Chuck Battikha and Doug Smith If you’ve ever had to create a Failure Modes, Effects and Diagnostic Analysis (FMEDA), you know how difficult and painstaking a task it can be. But FMEDAs are essential in ensuring that your SoCs satisfy ISO 26262 functional safety analysis requirements for automotive designs and for demonstrating that your design is indeed safe. Because of the intens... » read more

What’s In Your IP?


Jeff Markham, software architect at ClioSoft, talks with Semiconductor Engineering about IP traceability in markets such as automotive and aerospace, what’s actually in IP, what should not be in that IP from a security standpoint, and how all of this data can used to avert system reliability issues in the future. » read more

Automotive Chip Design Workflow


Stewart Williams, senior technical marketing manager at Synopsys, talks about the consolidation of chips in a vehicle and the impact of 7/5nm on automotive SoC design, how to trade off power, performance, area and reliability, and how ISO 26262 impacts those variables. » read more

Redefining Analog Fault Simulation For Automotive Functional Safety And Test Coverage Analysis


The growth in safety-critical applications has ushered in a paradigm shift in automotive IC functional safety and test coverage analysis. The increased need for safety, low defect rate, and long-term reliability is driving automotive IC designers to augment expert judgment with systematic fault simulation, to ensure a high degree of confidence in their analysis and to comply with the stringent ... » read more

Uses, Limits And Questions For FPGAs In Autos


Programmable logic in automotive applications is essential, given the parade of almost constant updates and shifts in direction, but exactly where the technology will be used has become a moving target. This isn't entirely surprising in the automotive industry. Carmakers are moving into electrification and increasing levels of automation in fits and starts, sometimes with dramatic swings in ... » read more

Push-Button FMEDAs for Automotive Safety


Automotive designs require functional safety analysis, typically accomplished using Failure Modes, Effects and Diagnostic Analysis (FMEDA), used to determine each safety goal’s diagnostic coverage. Writing an FMEDA is a highly tedious task, so we share a push-button solution for creating and automating the FMEDA process, giving engineers more time to focus on exploring design safety readiness... » read more

Ensuring Functional Safety In Design


Mohammed Abdelwahid (Ali), automotive logic test product manager at Mentor, a Siemens Business, discusses how to maximize coverage in the different ASIL standards for logic BiST, how to make testing more efficient, and what impact that has on area and test time. » read more

← Older posts Newer posts →