Remotely Performing IC Validation


One of the key stages in designing any chip is the testing you do when you get the first silicon back. This is where you finally see the results of all your careful work and determine whether the chip is performing as designed, and as simulation told you it would. This is known as IC validation. The focus of validation is on functional test – checking that the chip in silicon meets the origin... » read more

System-Level Test: Where Does It Fit?


Our second C-Brief discusses where system-level test (SLT) best fits into your semiconductor test workflow. With automated testing equipment (ATE), a traditional workflow may consist of: Wafer sort (WS) Burn-in after packaging (BI) Combination of structural testing (ST) and functional testing (FT). As demands on high-volume manufacturing shift in response to wider industry and com... » read more

Test Challenges Grow


Semiconductor Engineering sat down to discuss current and future test challenges with Dave Armstrong, director of business development at Advantest; Steve Pateras, product marketing director for Silicon Test Solutions at Mentor Graphics; Robert Ruiz, senior product marketing manager at Synopsys; Mike Slessor, president of FormFactor; and Dan Glotter, chief executive of Optimal+. SE: In our ... » read more