tag: image sensors

Detecting Spatial Blotches In Image Sensor Devices
By Christos Pantelidis - 12 Apr, 2022 - Comments: 0

One of the most common defects in image sensor devices is spatial blotches. The appearance of blotches in image sensors is a regular occurrence and may be generated by internal moving parts or may be moved by air currents within the camera. Composed of two main statistical methods, the first module employs an inferential method, applying a spatial segmentation of the current frame to obtain ... » read more

Graphene and two-dimensional materials for silicon technology
By Technical Paper Link - 02 Oct, 2020 - Comments: 1

Abstract: "The development of silicon semiconductor technology has produced breakthroughs in electronics—from the microprocessor in the late 1960s to early 1970s, to automation, computers and smartphones—by downscaling the physical size of devices and wires to the nanometre regime. Now, graphene and related two-dimensional (2D) materials offer prospects of unprecedented advances in device ... » read more

Reducing Data At The Source
By Ed Sperling - 18 Nov, 2019 - Comments: 0

Jens Döge, group manager for image acquisition and processing in Fraunhofer IIS’ Engineering of Adaptive Systems Division, talks about how to slash the amount of data that needs to be sent to the cloud or edge for processing by focusing only on the regions of interest in an image, and how that reduces the cost of moving that data. » read more

Advances In 3D CMOS Image Sensors Optical Modeling: Combining Realistic Morphologies With FDTD
By Coventor - 16 Oct, 2019 - Comments: 0

This paper describes an innovative methodology to investigate the relationship between device morphology and the optical performance of CMOS image sensors. By coupling a FDTD-based 3D Maxwell solver with silicon-accurate process modeling software, we have been able to analyze the sensitivity of image sensor quantum efficiency with respect to statistical variations in nm-scale device topology. A... » read more

Racing To The Edge
By Susan Rambo And Ed Sperling - 09 Apr, 2019 - Comments: 0

The race is on to win a piece of the edge, despite the fact that there is no consistent definition of where the edge begins and ends or how the various pieces will be integrated or ultimately tested. The edge concept originated with the Internet of Things, where the initial idea was that tens of billions of dumb sensors would communicate through gateways to the cloud. That idea persisted unt... » read more

The Week In Review: Design
By Jesse Allen - 08 Dec, 2017 - Comments: 0

M&A Design services firm Synapse Design acquired the assets of ACEIC Design Technologies, including the engineering team and verification IP. ACEIC, which was based in Bangalore, primarily focused on verification services for wireless 802.11ac MAC IP. This is only the latest expansion move from Synapse. Earlier this year, the company acquired the services companies Tech Vulcan in San Diego... » read more

Analog FastSpice Platform Full-Spectrum Sampled Periodic Noise Analysis
By Mentor, a Siemens Business - 29 Jul, 2015 - Comments: 0

Many high-performance analog/mixed-signal ICs include track-and-hold circuits to sample analog signals at one or more discrete timepoints per period. Although track-and-hold circuits are periodic, traditional periodic noise (pnoise) analysis does not apply because it measures the device noise impact integrated over an entire period rather than at instantaneous time points within the target peri... » read more

Winners And Losers
By Joanne Itow - 20 Sep, 2012 - Comments: 0

By Joanne Itow Semiconductor revenues will log in a relatively lackluster growth for 2012, only 3% more than 2011. That is below the 4.8% CAGR (compound annual growth rate) over the past five years and well below the 8.4% CAGR over the past 10 years. On the other hand, semiconductor units continue to show healthy growth, driving up wafer demand. Units will grow slightly faster compared to the ... » read more

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