Are Today’s MEMS Gyros “Good Enough”?


The gyroscope market is heating up, fueled by increasingly autonomous vehicles, robots, and industrial equipment, all of which are demanding greater precision and ever-smaller devices. Gyroscopes historically have been a staple in navigation for years. However, classic designs are macro-mechanical, and high-performance units can be very expensive. For lower-performance applications, micro-el... » read more

Re-Imagining Electrical System Design


Electrical system complexity is reaching a tipping point across industries, from modern passenger vehicles to sophisticated industrial machines that can now contain nearly 5,000 wiring harnesses. The electrical systems of these machines contain multiple networks, thousands of sensors and actuators, miles of wiring and tens of thousands of discrete components. Designing these complex systems is ... » read more

Designing Resilient Electronics


Electronic systems in automobiles, airplanes and other industrial applications are becoming increasingly sophisticated and complex, required to perform an expanding list of functions while also becoming smaller and lighter. As a result, pressure is growing to design extremely high-performance chips with lower energy consumption and less sensitivity to harsh environmental conditions. If this ... » read more

Artificial Intelligence For Industrial Applications


By Dirk Mayer and Olaf Enge-Rosenblatt Due to digitalization, modern machines and systems provide massive quantities of data, which form a significant basis for the optimization of production processes, operations and safety. These data sets, however, grow more and more complex, which renders the simple analysis methods typically used in the past often ineffective. This is one factor driv... » read more

Failure Analysis Becoming Critical To Reliability


Failure analysis is rapidly becoming a complex, costly and increasingly time-consuming must-do task as demand rises for reliability across a growing range of devices used in markets ranging from automotive to 5G. From the beginning, failure analysis has been about finding out what went wrong in semiconductor design and manufacturing. Different approaches, tools and equipment have improved ov... » read more

Ensuring Functional Safety In Design


Mohammed Abdelwahid (Ali), automotive logic test product manager at Mentor, a Siemens Business, discusses how to maximize coverage in the different ASIL standards for logic BiST, how to make testing more efficient, and what impact that has on area and test time. » read more

Betting On Hydrogen-Powered Cars


The automotive industry is taking another look at hydrogen fuel cells, but how they ultimately fare depends on a combination of consumer demand, automaker investment and infrastructure build-out. Hydrogen fuel cell technology has been steadily advancing over the past six decades since the first practical fuel cell system was demonstrated by Cambridge engineering professor Francis Bacon. The ... » read more

Service Revenue Growing With Chip Complexity


Rising complexity, new markets, and a shortage of in-house expertise are beginning to rekindle demand for services for the first time in nearly a decade. The semiconductor industry has been racing to design chips for a variety of new and existing applications, but they are facing challenges on a number of fronts: Leading-edge chips require new architectures due to a sharp reduction in s... » read more

Making Security User Friendly


Serious tradeoffs between technology accessibility and other optimization factors, such as power and security, can crop up especially in the early days of a new product’s design. A new product appeals to a certain category of users who need it to perform well enough that the technology can move forward. They are willing to overlook rough edges in the product and sometimes even glory in the le... » read more

Using Better Data To Shorten Test Time


The combination of machine learning plus more sensors embedded into IC manufacturing equipment is creating new possibilities for more targeted testing and faster throughput for fabs and OSATs. The goal is to improve quality and reduce the cost of manufacturing complex chips, where time spent in manufacturing is ballooning at the most advanced nodes. As the number of transistors on a die incr... » read more

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